FISCHER FISCHERSCOPE X-RAY XDLM 231, Operator'S Manual

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FISCHERSCOPE ® X-RAY 127
Def.MA
16 Def.MA
If you have activated the SUPER software, you can create a Def.MA by yourself.
The usage of the SUPER software requires deep knowledge of the physics of x-ray fluorescence and
the functionality of the instrument.
Alternatively, you can request a new measurement application from FISCHER. FISCHER offers a
professional service for the creation of customer’s Def.MA.
16.1 The Def.MA Modes
When you create a new Def.MA, you can choose between different modes. The mode determines
the measurement method and the presentation of the measurement readings.
Table 16-1: Def.MA Modes
Mode Application
Material analysis For the analysis of bulk material (massive specimens).
Analysis with bal-
ance For the analysis of bulk material (massive specimens), if the specimen can-
not be defined completely by 100 percent.
Typical applications: recycling, RoHS, soil specimens, biological specimens
Thickness mode For coating thickness measurements. The measurement results for the coat-
ing thickness are displayed in the typical units of length such as μm. The
analysis results are shown in percent units.
The density values of the elements are taken from internal tables. You do
have the option to change these values.
Mass per unit
area (relative) For coating thickness measurements. The overall area mass is displayed as
well as the percentage portion of the individual elements.
Mass per unit
area (absolute) For coating thickness measurements. The overall area mass is displayed as
well as the individual area masses of the respective elements.
Solution analysis You fill the measuring cell with the solution to be analyzed, see Chap. 19.2
on Page 156.
ROI-Mode ROI = Region of interest
Only a defined portion of the measures spectra is evaluated. You define
one or more regions (ROI) of energy channels. The portion of the spectra
that is located in the defined region is evaluated only.
Counting rates are issued, the fundamental parameter method is not used.
Used for special applications, where the fundamental parameter method is
not applicable.