FISCHER FISCHERSCOPE X-RAY XDLM 231, Operator'S Manual

Page: 218 / 236

216 FISCHERSCOPE ® X-RAY
Features of WinFTM BASIC and LIGHT
2.10 Measurement Data Management
2.11 Displaying, Documenting and Backing up Measurement Results and
Parameters
Function Description
Block function A block is a concluded series of measurements. Measurement data
is stored and evaluated as blocks, including the date and time of
the measurement, a notepad, the continuous number of the block
as well as block-related data. The content of additional data fields
such as order number, batch number, and operator name can be
defined freely.
Tagging and commenting
blocks Blocks can be tagged with event marks and can receive com-
ments. For example, in the course of a process that is to be con-
trolled, you can tag certain events by adding event marks and
adding comments to the related block.
Deleting measurement data
and blocks Measurement data and blocks can be deleted, overwritten and un-
deleted.
Function Description
Displaying the measure-
ment results You can display the measurement results in list form, as SPC chart
or as a large number display (with optional display of the meas-
urement uncertainty). The resolution (Number of decimal places)
can be set.
BASIC: Up to 24 result
channels,
LIGHT: Up to 3 result chan-
nels You can control the representation for each channel individually.
Editing the video image
and storing it together with
the product You can edit the video image with a graphic program of your
choice e.g. for adding comments, dimensions and explanatory
text. The edited video image is stored together with the product.
Print functions With black and white printers, color values are printed in gray-
scale automatically. For larger page widths, the printer is switched
automatically to landscape format and reduction of the type size.
SPC presentation of the
measurement results The SPC chart can directly be displayed on the monitor as x-bar/
s chart or x-bar/r chart. For automated measurement sequences
with large batch sizes, you can easily recognize long-term chang-
es of the coating thickness and of other process parameters
through the presentation of a trend line. This enables, among other
things, the testing of the measurement device capability.