FISCHER FISCHERSCOPE X-RAY XDLM 231, Operator'S Manual

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210 FISCHERSCOPE ® X-RAY
Features of WinFTM BASIC and LIGHT
2.4 Material Analysis

Quantitative material analysis of complex layers. Individual layers may consist of several
elements. The total number of measured quantities amounts up to 24 with WinFTM BASIC and
4 with WinFTM LIGHT.

Quantitative analysis of solid, powder or paste materials as well as solutions for up to 24
elements. The range of analysable elements depends on the detector (see Technical Data
Sheet).

Even buried layers can be analysed.

Analysis with balance: It is not required to completely define the composition of the specimen
by 100 percent. The analysis is performed by matching the peak areas, without the need for
the sum of concentrations amounting to 100 percent. Applicable for recycling, analysis of trace
elements in plastics, soil specimens, biological specimens and non-homogeneous composites.
2.5 Direct Analysis in the Spectrum

Solid specimens with unknown compositions can be easily analyzed in the spectrum mode of
WinFTM. Instead of defining the composition via Def.MA, only the relevant elements need to
be highlighted. A calibration is not necessary. Specimens can consist of a maximum of 24
elements with WinFTM BASIC or 5 elements with WinFTM LIGHT.

Matrix effects and cross-excitation are taken into account.

The residual is displayed. The residual is the spread between the calculated sum spectrum and
the measured spectrum. You receive references to a potentially wrong selection of the elements
to be measured.
The direct analysis is not feasible for the analysis of light elements, solutions or coating systems.