Digital Equipment DECstation 5000/100 Series, Maintenance Manual

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Locating Individual Tests
This appendix groups together individual tests for each base
system module. The individual tests in each group are listed
in alphabetical order by test command. Table D-1 lists the
individual tests for each module.
Table D-1. Individual Tests and Utilities
Module Tested Individual Test or Utility
Test or Utility
Command
System module Halt button test
t 3/misc/halt
[ number ]
Nonvolatile RAM (NVR) test t 3/rtc/nvr [ pattern ]
Overheat detect test t 3/misc/pstemp
Real-time clock period test
t 3/rtc/period
Real-time clock register test t 3/rtc/regs
Real-time test
t 3/rtc/time
Serial communication chip (SCC) access
test
t 3/scc/access
Serial communication chip (SCC) DMA
test
t 3/scc/dma [
line
]
[
loopback
] [
baud
]
Serial communication chip (SCC)
interrupts test
t 3/scc/int
[ line ]
Serial communication chip (SCC) I/O
test
t 3/scc/io [ line ]
[ loopback ]
Serial communication chip (SCC) pins
test
t 3/scc/pins [
line
]
[
loopback
]
Serial communication chip (SCC)
transmit and receive test
t 3/scc/tx-rx
[ line ]
[ loopback ] [ baud ]
CPU module Cache data test
t 3/cache/data
[
cache
] [
address
]
Cache fill test t 3/cache/fill
[ cache ] [ offset ]
Cache isolate test t 3/cache/isol
[ cache ]
(continued on next page)
D–2 Base System Test Commands and Messages