Specifications
12
MiniFlex 600: Benchtop X-ray Diffractometer
Optional accessories
Counter monochromator
D/teX Ultra High-speed 1D detector
Sample rotation attachment
6 sample changer ASC-6 AMII
General atmosphere separator (quick air-tight sample attachment)
Optional software
・
PDXL software (Integrated Powder X-ray Diffraction Software)
・
ICDD software
・
ICDD database software (Qualitative analysis database)
・
Environmental dust quantitative-analysis (SiO
2
, etc.) software
・
Quantitative analysis software (quantitative analysis through the use of the
calibration-curve method and standard addition method)
D/teX Ultra High-speed 1D Detector (Optional)
Detection element: 1D semiconductor element
Window material:
Be
Effective window size: 13 mm (W) × 20 mm(H)
Dimensions:
80 mm (L)
Included accessory: Beam stop
Variable knife edge
The following items are specifications that differ from SC:
2θ measurement range: +2° to +140°
Slit:
SS
8 mm (also called AS: Antiscatter slit)
ICDD
:
International Center
for Diffraction Data