Measurement with MiniFlex Guidance
MiniFlex 600: Benchtop X-ray Diffractometer
87
Step :
0.02
°
Scan speed:
3
°
/min
BG condition:
Do not measure (Uncheck the
BG Measurements
check
box shown in Fig. 8.7.)
For precision measurement of diffracted ray intensity, check the
BG
Measurements
checkbox, click the
Condition
button of
BG Conditions
(see
Fig. 8.7), and enter the angles of the left-side and right-side tails of the peak to
the start angle and stop angle respectively.
When a measurement is performed at tube voltage of 34 kV or more, an escape
peak appears from the iodine used in the scintillator of SC. For Cu-Ka, it is
observed as a wide peak around 2θ = 5 to 15°. This can be eliminated by setting
the tube voltage below 34 kV or using the counter monochromator. When the
D/teX Ultra is used as the detector, an escape peak will not appear.
The conditions for qualitative analysis data measurement when using D/teX
Ultra as the detector are as follows. Enter the measurement conditions by
using these conditions as a reference.
X-ray:
40 kV – 15 mA
Divergence slit: DS = 1.25
°
* If main diffracted rays are present near the 2
θ
axis of 10
°
angle, select the 0.625
°
DS.
Scattering slit:
SS = OPEN
* When using the DS = 1.25° or the DS = 0.625°, use
OPEN (13 mm). When removing the variable knife edge
and using OPEN (13 mm) due to collision with
attachment, and if the scattering X-rays affects the X-ray
profile, use the 8-mm SS. The scattering X-rays will be
reduced.
Receiving slit:
RS = OPEN
* When using this slit for a measurement, use OPEN (13
mm). Insert the Ni filter into the position of the receiving
slit. There are two types of Ni filter: standard type (0.015
mm) and twice as thick type (0.030 mm). If Kβ X-ray
issues occur with the standard type, use the twice as thick
type.
Slit condition:
Va Fixed slit system
Scan axis:
Theta/2-Theta (Fixed)
Measurement mode: Continuous (Fixed)
