MiniFlex 600: Benchtop X-ray Diffractometer
1
Overview
Before starting to use the MiniFlex 600 Benchtop X-ray Diffractometer (hereon
called MiniFlex 600), be sure to read this instruction manual thoroughly. Also, be
sure to read the "Guidelines for safe use of the Benchtop X-ray Diffractometer"
(ME11594*).
Overview of MiniFlex 600
The MiniFlex 600 is a successor of the MiniFlex Benchtop X-ray Diffractometer
(XRD) series. The MiniFlex 600 significantly improved its basic performance
while maintaining the compact size of MiniFlex series products.
Characteristics of MiniFlex 600
・
By incorporating the real-time angle correction system, compact and wide-area
scintillation counter (hereafter called SC) which is equivalent to intensity of
150%, counter monochromator (optional) and other features, MiniFlex 600 has
significantly enhanced its basic specifications as a powder XRD system in terms
of angle accuracy, intensity and P/B ratio. Thus, a high quality data can be
obtained from a XRD system completed in a compact enclosure.
・
An X-ray generator of 600 W (40 kV - 15 mA) enables 1.3 times higher output
than the existing model.
・
The system is a location-free tool that can readily be transported and installed in a
relatively small indoor or outdoor space.
Optional accessories to enable good quality high speed measurements
・
The MiniFlex 600 can be used for a variety of applications; starting from
diffraction pattern comparison of polycrystalline materials (such as powder
samples and metal plates) and up to qualitative & quantitative analyses as well as
quality control management of raw materials and products. Optional softwares*
for these purposes are available.
・
Optional sample attachments, such as sample rotation attachment*, sample
changer*, and general atmosphere separator* can be used to improve quantitative
measurement accuracy or to automate the measurement.
・
The counter monochromator* cuts X-rays (fluorescence X-rays, etc.) other than
the characteristic X rays (CuKα) used for the analysis. When the counter
monochromator is used, the data with low background and high P/B ratio can be
obtained.
・
By replacing the SC with D/teX Ultra high-speed 1D detector*, a measurement
with 100 times higher intensity than SC, under the same slit conditions, is
enabled.
Items with * are optional.