Measurements
R&S
®
FSW
195
User Manual 1173.9411.02 ─ 19
SEM measurement configurations can be saved to an xml file which can then be
exported to another application or loaded on the R&S
FSW again at a later time. Some
predefined XML files are provided that contain ranges and parameters according to the
selected standard.
In order to improve the performance of the R&S
FSW for spectrum emission mask
measurements, a "Fast SEM" mode is available.
Monitoring compliance of the spectrum is supported by a special limit check for SEM
measurements.
5.6.2 Typical Applications
Spectrum Emission Mask measurements are typically performed to ensure that modu-
lated signals remain within the valid signal level ranges defined by a particular trans-
mission standard, both in the transmission channel and neighboring channels. Any vio-
lations of the mask may interfere with other transmissions.
The 3GPP TS 34.122 standard, for example, defines a mask for emissions outside the
transmission channel. This mask is defined relative to the input signal power. Three
frequency ranges to each side of the transmission channel are defined.
5.6.3 SEM Results
As a result of the Spectrum Emission Mask measurement, the measured signal levels,
the result of the limit check (mask monitoring) and the defined limit lines are displayed
in a diagram (see also
chapter 5.6.4.2, "Limit Lines in SEM Measurements"
on page 201). Furthermore, the TX channel power "P" is indicated with the used
power class.
Multi-SEM measurements
For multi-SEM measurements, that is, SEM measurements with more than one sub
block, each sub block has its own power class definitions. In this case, the power class
is not indicated in the graphical result displays.
Example:
For example, in
, "31 < P < 39" is indicated as the used power class is
defined from 31 to 39.
Spectrum Emission Mask (SEM) Measurement
