Abbott i-STAT 1, System Manual

Page: 210 / 658

14-16
Art: 714376-00M Rev. Date: 31-Jan-12
TROUBLESHOOTING FAILED ELECTRONIC SIMULATOR TEST
Introduction
The cartridge or an external Electronic Simulator should be rerun to confirm
the failure. The analyzer’s connector pins are in contact with the biosensor
chips in the cartridge being tested when the internal Electronic Simulator test is
being performed. The test can fail if the contact pads have been contaminated
in some way.
Lockout Enabled: Rerun the cartridge in the same analyzer to ensure the
FAIL was not due to a one-time spike of electrical noise. If the test fails again,
rerun the cartridge in another analyzer if immediately available. Note that the
cartridge should not be run if there is more than a three minute delay from the
time it is filled. If the cartridge fails in more than one analyzer, use another
cartridge. When Lockout is enabled, the analyzer will continue to perform
the internal Electronic Simulator test each time a cartridge is inserted until the
test (internal or external) passes.
Lockout Not Enabled: Rerun the cartridge in another analyzer if immediately
available. Note that the cartridge should not be run if there is more than a
three minute delay from the time it is filled. When Lockout is not enabled, the
analyzer will run the next cartridge without performing the internal Electronic
Simulator test until the specified time has elapsed. Verify the analyzer using
an external Electronic Simulator.
With both the internal and external Electronic Simulator, an analyzer may
occasionally fail a simulator test even though it is in proper operating condition
due to the extremely sensitive nature of the test.
External Simulator
Run the test again or try another simulator, as it is possible that the test will
pass on a second try. The test can also fail if the external Electronic Simulator
is malfunctioning such as after being dropped.
Occasionally when an analyzer is moved from a cold environment to a warm,
humid environment, moisture may condense on the internal connector. An
analyzer in this condition will fail the electronic test and the failure code “L” will
be displayed. Allow the analyzer to sit for half an hour to allow the moisture
to evaporate, then insert the Electronic Simulator again. If the analyzer passes
the second electronic test, continue using it. If the analyzer fails the second
time, record the letter or Quality Check Code displayed with the FAIL message
and refer to Support Services information in the Troubleshooting section.
Internal Simulator
Caution The analyzer will continue to initialize test cycles when the analyzer is customized
to warn, but not block testing when a scheduled external Electronic Simulator
test is missed, when a FAIL result for the external Electronic Simulator test is
ignored, and when the analyzer fails the internal Electronic Simulator test and
the lockout feature is not enabled.