IBM pSeries 670, Service Manual

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Error Code Description Action/
Possible Failing FRU
450F 28B0 Memory subsystem and error code
generation/logging detected fault in I/O
subsystem PCI backplane
I/O subsystem PCI backplane at location
specified in error code
450F 28B1 Memory subsystem and error code
generation/logging detected fault in I/O
subsystem DASD backplane
I/O subsystem DASD backplane at location
specified in error code
450F 302A Memory subsystem and error code
generation/logging detected fault in 8 GB
memory book (inner)
Go to “MAP 1540: Problem Isolation
Procedures” on page 253 to isolate the failing
component.
450F 302B Memory subsystem and error code
generation/logging detected fault in 8 GB
memory book (outer)
Go to “MAP 1540: Problem Isolation
Procedures” on page 253 to isolate the failing
component.
450F 302C Memory subsystem and error code
generation/logging detected fault in 32 GB
memory book (inner)
Go to “MAP 1540: Problem Isolation
Procedures” on page 253 to isolate the failing
component.
450F 302D Memory subsystem and error code
generation/logging detected fault in 32 GB
memory book (outer)
Go to “MAP 1540: Problem Isolation
Procedures” on page 253 to isolate the failing
component.
450F 305A Memory subsystem and processor subsystem
tests detected fault in 8 GB memory book
(inner)
Go to “MAP 1544: Inner L3 Module Problem
Isolation” on page 282.
450F 305B Memory subsystem and processor subsystem
tests detected fault in 8 GB memory book
(outer)
Go to “MAP 1545: Outer L3 Module Problem
Isolation” on page 284.
450F 305C Memory subsystem and error code
generation/logging detected fault in 4 GB inner
memory book
Go to “MAP 1544: Inner L3 Module Problem
Isolation” on page 282.
450F 305D Memory subsystem and error code
generation/logging detected fault in 4 GB outer
memory book
Go to “MAP 1545: Outer L3 Module Problem
Isolation” on page 284.
450F 305E Memory subsystem and error code
generation/logging detected fault in 16 GB inner
memory book
Go to “MAP 1544: Inner L3 Module Problem
Isolation” on page 282.
450F 305F Memory subsystem and error code
generation/logging detected fault in 16 GB outer
memory book
Go to “MAP 1545: Outer L3 Module Problem
Isolation” on page 284.
450F 307A Memory subsystem and processor subsystem
tests detected fault in 4 GB inner memory book
Go to “MAP 1544: Inner L3 Module Problem
Isolation” on page 282.
450F 307B Memory subsystem and processor subsystem
tests detected fault in 8 GB inner memory book
Go to “MAP 1544: Inner L3 Module Problem
Isolation” on page 282.
450F 307C Memory subsystem and processor subsystem
tests detected fault in 16 GB inner memory
book
Go to “MAP 1544: Inner L3 Module Problem
Isolation” on page 282.
450F 307D Memory subsystem and processor subsystem
tests detected fault in 16 GB inner memory
book
Go to “MAP 1544: Inner L3 Module Problem
Isolation” on page 282.
450F 307E Memory subsystem and processor subsystem
tests detected fault in 16 GB inner memory
book
Go to “MAP 1544: Inner L3 Module Problem
Isolation” on page 282.
Chapter 5. Error Code to FRU Index
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