IBM pSeries 670, Service Manual

Page: 660 / 1032

Error Code Description Action/
Possible Failing FRU
450D 307A Memory subsystem and processor subsystem
tests detected fault in 4 GB inner memory book
Go to “MAP 1544: Inner L3 Module Problem
Isolation” on page 282.
450D 307B Memory subsystem and processor subsystem
tests detected fault in 8 GB inner memory book
Go to “MAP 1544: Inner L3 Module Problem
Isolation” on page 282.
450D 307C Memory subsystem and processor subsystem
tests detected fault in 16 GB inner memory
book
Go to “MAP 1544: Inner L3 Module Problem
Isolation” on page 282.
450D 307D Memory subsystem and processor subsystem
tests detected fault in 16 GB inner memory
book
Go to “MAP 1544: Inner L3 Module Problem
Isolation” on page 282.
450D 307E Memory subsystem and processor subsystem
tests detected fault in 16 GB inner memory
book
Go to “MAP 1544: Inner L3 Module Problem
Isolation” on page 282.
450D 308A Memory subsystem and processor subsystem
tests detected fault in 4 GB outer memory book
Go to “MAP 1545: Outer L3 Module Problem
Isolation” on page 284.
450D 308B Memory subsystem and processor subsystem
tests detected fault in 4 GB outer memory book
Go to “MAP 1545: Outer L3 Module Problem
Isolation” on page 284.
450D 308C Memory subsystem and processor subsystem
tests detected fault in 4 GB outer memory book
Go to “MAP 1545: Outer L3 Module Problem
Isolation” on page 284.
450D 308D Memory subsystem and processor subsystem
tests detected fault in 4 GB outer memory book
Go to “MAP 1545: Outer L3 Module Problem
Isolation” on page 284.
450D 308E Memory subsystem and processor subsystem
tests detected fault in 4 GB outer memory book
Go to “MAP 1545: Outer L3 Module Problem
Isolation” on page 284.
450D 30BD Memory subsystem and processor subsystem
tests detected fault in 8 GB or 16 GB CUoD
inner memory book
Go to “MAP 1544: Inner L3 Module Problem
Isolation” on page 282.
450D 30C3 Memory subsystem and processor subsystem
tests detected fault in 32 GB or 64 GB CUoD
inner memory book
Go to “MAP 1544: Inner L3 Module Problem
Isolation” on page 282.
450D 30C6 Memory subsystem and processor subsystem
tests detected fault in 8 GB or 16 GB CUoD
outer memory book
Go to “MAP 1545: Outer L3 Module Problem
Isolation” on page 284.
450D 30CC Memory subsystem and processor subsystem
tests detected fault in 32 GB or 64 GB CUoD
outer memory book
Go to “MAP 1545: Outer L3 Module Problem
Isolation” on page 284.
450E 248B Memory subsystem and scan control routines
detected fault in operator panel
Operator panel
Location: U1.17-L1
450E 25C0 Memory subsystem and scan control routines
detected fault in system backplane
System backplane
Location: U1.18-P1
450E 25C1 Memory subsystem and scan control routines
detected fault in 1.0 GHz clock card
Clock card
Location: U1.18-P1-X5
450E 25D9 Memory subsystem and scan control routines
detected fault in L3 VPD card used with 1.1
GHz MCM and 1.3 GHz MCM
Go to “MAP 1548: Memory and Processor
Problem Isolation” on page 290.
450E 25E7 Fault in L3 VPD card used with 1.5 GHz and
1.7 GHz MCMs
Go to “MAP 1548: Memory and Processor
Problem Isolation” on page 290.
450E 25E8 Fault in L3 VPD card used with 1.5 GHz and
1.7 GHz MCMs
Go to “MAP 1548: Memory and Processor
Problem Isolation” on page 290.
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pSeries 670 Service Guide