IBM pSeries 670, Service Manual

Page: 461 / 1032

Service Processor Error Codes
Attention: Follow the procedure defined in “Checkpoints and Error Codes Index” on page 348. If you
replace FRUs or perform an action on an I/O subsystem and the problem is still not corrected, go to “MAP
1542: I/O Problem Isolation” on page 261 unless you were already directed to any MAP 154
x by the error
code. Otherwise call support if the action(s) for an error code do not resolve the problem.
Attention: If the error code that brought you to this chapter originated in the AIX error log, remember
that an error may require an additional 15 minutes to be propagated to the AIX error log.
If you replace FRUs and the problem is corrected, go to
″
MAP 0410: Repair Checkout
″
in the RS/6000
and
Eserver
pSeries Diagnostic Information for Multiple Bus Systems .
Note: The MCM and its associated VPD card are a single FRU, and must be replaced as a set.
Error Code Description Action/
Possible Failing FRU
4064 0001 Processor subsystem tests detected clock card
assembly failure
Go to “MAP 1540: Problem Isolation
Procedures” on page 253.
4064 0002 Processor subsystem tests detected backplane
assembly failure
Go to “MAP 1540: Problem Isolation
Procedures” on page 253.
4064 0003 Processor subsystem tests detected fault in
MCM module 0
MCM module 0 and VPD card
Location: U1.18-P1-C1 and U1.18-P1-H2.3
4064 0004 Processor subsystem tests detected fault in
MCM module 2
MCM module 2 and VPD card
Location: U1.18-P1-C4 and U1.18-P1-H2.4
4064 0005 Processor subsystem tests detected fault in
MCM module 1
MCM module 1 and VPD card
Location: U1.18-P1-C3 and U1.18-P1-H2.5
4064 0006 Processor subsystem tests detected fault in
MCM module 3
MCM module 3 and VPD card
Location: U1.18-P1-C2 and U1.18-P1-H2.6
4064 0007 Processor subsystem tests detected fault in L3
VPD card
1. L3 VPD card
Location: U1.18-P1-H2.1
(Order the L3 cache module FRU to obtain
a new L3 VPD card. Return the L3 cache
module that was included in the FRU kit,
and the failing L3 VPD card as
″
new
defective
″
.)
2. Primary I/O book
Location: U1.18-P1-H2
4064 000A Processor subsystem tests detected fault in
primary I/O book 1 (slot 0)
Go to “MAP 1540: Problem Isolation
Procedures” on page 253.
4064 000B Processor subsystem tests detected fault in
secondary I/O book (slot 1)
Go to “MAP 1540: Problem Isolation
Procedures” on page 253.
4064 000C Processor subsystem tests detected fault in I/O
book 3 (slot 2)
Go to “MAP 1540: Problem Isolation
Procedures” on page 253.
4064 000D Processor subsystem tests detected fault in I/O
book 4 (slot 3)
Go to “MAP 1540: Problem Isolation
Procedures” on page 253.
4064 000E CUoD capacity card
1. Replace the CUoD capacity card
Location: U1.18-P1-H2.2
2. Ask the customer to reenter the CUoD
activation keys.
4064 0010 Processor subsystem tests detected fault in
Memory book (slot 0)
Memory book (slot 0)
Location: U1.18-P1-M2
Chapter 5. Error Code to FRU Index
441