IBM pSeries 670, Service Manual

Page: 648 / 1032

Error Code Description Action/
Possible Failing FRU
4506 307E Memory subsystem and processor subsystem
tests detected fault in 16 GB inner memory
book
Go to “MAP 1544: Inner L3 Module Problem
Isolation” on page 282.
4506 308A Memory subsystem and processor subsystem
tests detected fault in 4 GB outer memory book
Go to “MAP 1545: Outer L3 Module Problem
Isolation” on page 284.
4506 308B Memory subsystem and processor subsystem
tests detected fault in 4 GB outer memory book
Go to “MAP 1545: Outer L3 Module Problem
Isolation” on page 284.
4506 308C Memory subsystem and processor subsystem
tests detected fault in 4 GB outer memory book
Go to “MAP 1545: Outer L3 Module Problem
Isolation” on page 284.
4506 308D Memory subsystem and processor subsystem
tests detected fault in 4 GB outer memory book
Go to “MAP 1545: Outer L3 Module Problem
Isolation” on page 284.
45064 308E Memory subsystem and processor subsystem
tests detected fault in 4 GB outer memory book
Go to “MAP 1545: Outer L3 Module Problem
Isolation” on page 284.
4506 30BD Memory subsystem and processor subsystem
tests detected fault in 8 GB or 16 GB CUoD
inner memory book
Go to “MAP 1544: Inner L3 Module Problem
Isolation” on page 282.
4506 30C3 Memory subsystem and processor subsystem
tests detected fault in 32 GB or 64 GB CUoD
inner memory book
Go to “MAP 1544: Inner L3 Module Problem
Isolation” on page 282.
4506 30C6 Memory subsystem and processor subsystem
tests detected fault in 8 GB or 16 GB CUoD
outer memory book
Go to “MAP 1545: Outer L3 Module Problem
Isolation” on page 284.
4506 30CC Memory subsystem and processor subsystem
tests detected fault in 32 GB or 64 GB CUoD
outer memory book
Go to “MAP 1545: Outer L3 Module Problem
Isolation” on page 284.
4507 248B Memory subsystem and bus tests detected fault
in operator panel
Operator panel
Location: U1.17-L1
4507 25C0 Memory subsystem and bus tests detected fault
in system backplane
System backplane
Location: U1.18-P1
4507 25C1 Memory subsystem and bus tests detected fault
in 1.0 GHz clock card
Clock card
Location: U1.18-P1-X5
4507 25D9 Memory subsystem and bus tests detected fault
in L3 VPD card used with 1.1 GHz MCM and
1.3 GHz MCM
Go to “MAP 1548: Memory and Processor
Problem Isolation” on page 290.
4507 25E7 Fault in L3 VPD card used with 1.5 GHz and
1.7 GHz MCMs
Go to “MAP 1548: Memory and Processor
Problem Isolation” on page 290.
4507 25E8 Fault in L3 VPD card used with 1.5 GHz and
1.7 GHz MCMs
Go to “MAP 1548: Memory and Processor
Problem Isolation” on page 290.
4507 25F1 Memory subsystem and bus tests detected fault
in L3 VPD card used with 1.3 GHz MCM
Go to “MAP 1548: Memory and Processor
Problem Isolation” on page 290.
4507 25F9 Fault in L3 VPD card used with 1.5 GHz and
1.7 GHz MCMs
Go to “MAP 1548: Memory and Processor
Problem Isolation” on page 290.
4507 269A Fault in L3 VPD card used with 1.5 GHz and
1.7 GHz MCMs
Go to “MAP 1548: Memory and Processor
Problem Isolation” on page 290.
4507 28B0 Memory subsystem and bus tests detected fault
in I/O subsystem PCI backplane
I/O subsystem PCI backplane at location
specified in error code
4507 28B1 Memory subsystem and bus tests detected fault
in I/O subsystem DASD backplane
I/O subsystem DASD backplane at location
specified in error code
628
Eserver
pSeries 670 Service Guide