IBM pSeries 670, Service Manual

Page: 661 / 1032

Error Code Description Action/
Possible Failing FRU
450E 25F1 Memory subsystem and scan control routines
detected fault in L3 VPD card used with 1.3
GHz MCM
Go to “MAP 1548: Memory and Processor
Problem Isolation” on page 290.
450E 25F9 Fault in L3 VPD card used with 1.5 GHz and
1.7 GHz MCMs
Go to “MAP 1548: Memory and Processor
Problem Isolation” on page 290.
450E 269A Fault in L3 VPD card used with 1.5 GHz and
1.7 GHz MCMs
Go to “MAP 1548: Memory and Processor
Problem Isolation” on page 290.
450E 28B0 Memory subsystem and scan control routines
detected fault in I/O subsystem PCI backplane
I/O subsystem PCI backplane at location
specified in error code
450E 28B1 Memory subsystem and scan control routines
detected fault in I/O subsystem DASD
backplane
I/O subsystem DASD backplane at location
specified in error code
450E 302A Memory subsystem and scan control routines
detected fault in 8 GB memory book (inner)
Go to “MAP 1540: Problem Isolation
Procedures” on page 253 to isolate the failing
component.
450E 302B Memory subsystem and scan control routines
detected fault in 8 GB memory book (outer)
Go to “MAP 1540: Problem Isolation
Procedures” on page 253 to isolate the failing
component.
450E 302C Memory subsystem and scan control routines
detected fault in 32 GB memory book (inner)
Go to “MAP 1540: Problem Isolation
Procedures” on page 253 to isolate the failing
component.
450E 302D Memory subsystem and scan control routines
detected fault in 32 GB memory book (outer)
Go to “MAP 1540: Problem Isolation
Procedures” on page 253 to isolate the failing
component.
450E 305A Memory subsystem and processor subsystem
tests detected fault in 8 GB memory book
(inner)
Go to “MAP 1544: Inner L3 Module Problem
Isolation” on page 282.
450E 305B Memory subsystem and processor subsystem
tests detected fault in 8 GB memory book
(outer)
Go to “MAP 1545: Outer L3 Module Problem
Isolation” on page 284.
450E 305C Memory subsystem and scan control routines
detected fault in 4 GB inner memory book
Go to “MAP 1544: Inner L3 Module Problem
Isolation” on page 282.
450E 305D Memory subsystem and scan control routines
detected fault in 4 GB outer memory book
Go to “MAP 1545: Outer L3 Module Problem
Isolation” on page 284.
450E 305E Memory subsystem and scan control routines
detected fault in 16 GB inner memory book
Go to “MAP 1544: Inner L3 Module Problem
Isolation” on page 282.
450E 305F Memory subsystem and scan control routines
detected fault in 16 GB outer memory book
Go to “MAP 1545: Outer L3 Module Problem
Isolation” on page 284.
450E 307A Memory subsystem and processor subsystem
tests detected fault in 4 GB inner memory book
Go to “MAP 1544: Inner L3 Module Problem
Isolation” on page 282.
450E 307B Memory subsystem and processor subsystem
tests detected fault in 8 GB inner memory book
Go to “MAP 1544: Inner L3 Module Problem
Isolation” on page 282.
450E 307C Memory subsystem and processor subsystem
tests detected fault in 16 GB inner memory
book
Go to “MAP 1544: Inner L3 Module Problem
Isolation” on page 282.
450E 307D Memory subsystem and processor subsystem
tests detected fault in 16 GB inner memory
book
Go to “MAP 1544: Inner L3 Module Problem
Isolation” on page 282.
Chapter 5. Error Code to FRU Index
641