IBM pSeries 670, Service Manual

Page: 643 / 1032

Error Code Description Action/
Possible Failing FRU
4504 25E8 Fault in L3 VPD card used with 1.5 GHz and
1.7 GHz MCMs
Go to “MAP 1548: Memory and Processor
Problem Isolation” on page 290.
4504 25F1 Memory subsystem and processor subsystem
tests detected fault in L3 VPD card used with
1.3 GHz MCM
Go to “MAP 1548: Memory and Processor
Problem Isolation” on page 290.
4504 25F9 Fault in L3 VPD card used with 1.5 GHz and
1.7 GHz MCMs
Go to “MAP 1548: Memory and Processor
Problem Isolation” on page 290.
4504 269A Fault in L3 VPD card used with 1.5 GHz and
1.7 GHz MCMs
Go to “MAP 1548: Memory and Processor
Problem Isolation” on page 290.
4504 28B0 Memory subsystem and processor subsystem
tests detected fault in I/O subsystem PCI
backplane
I/O subsystem PCI backplane at location
specified in error code
4504 28B1 Memory subsystem and processor subsystem
tests detected fault in I/O subsystem DASD
backplane
I/O subsystem DASD backplane at location
specified in error code
4504 302A Memory subsystem and processor subsystem
tests detected fault in 8 GB memory book
(inner)
Go to “MAP 1544: Inner L3 Module Problem
Isolation” on page 282 to isolate the failing
component.
4504 302B Memory subsystem and processor subsystem
tests detected fault in 8 GB memory book
(outer)
Go to “MAP 1545: Outer L3 Module Problem
Isolation” on page 284 to isolate the failing
component.
4504 302C Memory subsystem and processor subsystem
tests detected fault in 32 GB memory book
(inner)
Go to “MAP 1544: Inner L3 Module Problem
Isolation” on page 282 to isolate the failing
component.
4504 302D Memory subsystem and processor subsystem
tests detected fault in 32 GB memory book
(outer)
Go to “MAP 1545: Outer L3 Module Problem
Isolation” on page 284 to isolate the failing
component.
4504 305A Memory subsystem and processor subsystem
tests detected fault in 8 GB memory book
(inner)
Go to “MAP 1544: Inner L3 Module Problem
Isolation” on page 282.
4504 305B Memory subsystem and processor subsystem
tests detected fault in 8 GB memory book
(outer)
Go to “MAP 1545: Outer L3 Module Problem
Isolation” on page 284.
4504 305C Memory subsystem and processor subsystem
tests detected fault in 4 GB inner memory book
Go to “MAP 1544: Inner L3 Module Problem
Isolation” on page 282.
4504 305D Memory subsystem and processor subsystem
tests detected fault in 4 GB outer memory book
Go to “MAP 1545: Outer L3 Module Problem
Isolation” on page 284.
4504 305E Memory subsystem and processor subsystem
tests detected fault in 16 GB inner memory
book
Go to “MAP 1544: Inner L3 Module Problem
Isolation” on page 282.
4504 305F Memory subsystem and processor subsystem
tests detected fault in 16 GB outer memory
book
Go to “MAP 1545: Outer L3 Module Problem
Isolation” on page 284.
4504 307A Memory subsystem and processor subsystem
tests detected fault in 4 GB inner memory book
Go to “MAP 1544: Inner L3 Module Problem
Isolation” on page 282.
4504 307B Memory subsystem and processor subsystem
tests detected fault in 8 GB inner memory book
Go to “MAP 1544: Inner L3 Module Problem
Isolation” on page 282.
4504 307C Memory subsystem and processor subsystem
tests detected fault in 16 GB inner memory
book
Go to “MAP 1544: Inner L3 Module Problem
Isolation” on page 282.
Chapter 5. Error Code to FRU Index
623