Hioki 3504-40 C HiTester, Instruction Manual

Page: 21 / 292

1.4 Names and Functions of Parts
15
9
1
High
Low
Sampling error
Displayed when the A/D
conversion is not carried out
normally.
ERR
output
,
HI
judgment,
OUT
judgment
• It is possible that the device is being affected by
incoming noise.
• Problem with the device.
Submit it for repairs.
Abnormal connection
on the H side
Contact Abnormality
Displayed when the connection
resistance between the mea-
surement terminal and the ob-
ject to be measured becomes
large.
See
(p. 102)
ERR
output
,
HI
judgment,
OUT
judgment
• The measurement terminals may not be con-
nected to the object being measured.
Check the contact between the object being
measured and the measurement terminals.
Abnormal connection
on the L side
Abnormal connection
on the H, L side
Applied voltage
abnormality
Displayed when the voltage be-
tween the measurement termi-
nals is lower than the measured
voltage.
ERR
output
,
HI
judgment,
OUT
judgment
• The H
POT
and H
CUR
terminals may be discon-
nected. Check the connection between the
measurement sample and the terminals.
• There may be a high contact resistance
between the H
CUR
and L
CUR
terminals and the
object being measured.
Normal
measurement value
Low C Connector error
Displayed when the measured
value is abnormally lower than
the measurement range.
ERR
output
Normal
evalua-
tion
• The measurement terminals may not be con-
nected to the object being measured.
Check the contact between the object being
measured and the measurement terminals.
Abnormal level detected
Displayed when the inspection
level abnormality monitor value
fluctuates.
See
(p. 99)
ERR
output
,
HI
judgment,
OUT
judgment
• hattering may have occurred.
Check the connection between the measure-
ment sample and the terminals.
It is possible that the device is being affected by
incoming noise.
• Use the shielding process as a countermeasure
agains
Priority
rank
MAIN display Error content
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