TM 11-6625-3145-14
Verification and Adjustment Procedures-318/338 Service
THRESHOLD LEVEL TTL
1. Repeat the following procedures, (2) through (4), for each of the two power supply voltage levels given in Table
2. Set the pulse generator output level to that given in Table 5-18 as measured by the oscilloscope. Setup the
oscilloscope as follows:
a.
Set the DVM for +1.40 V.
b.
Momentarily move the oscilloscope CH1 probe to measure the DVM’s + 1.40 V output.
c.
Set the oscilloscope’s vertical VOLTS/DIV to 200 mv (20 mv with 10X probe)
d.
Adjust the vertical position so that the trace is at midscreen (+1.40 V at midscreen).
e.
Return the oscilloscope CH1 probe to the pulse generator’s BNC T-connector.
f.
Adjust the pulse generator output so that the signal is 1 1/4 divisions above and 1 1/4 divisions below
midscreen (+1.15 V to =1.65 V).
g. Set the power supply level to the voltage given in Table 5-18 as measured by the DVM.
3. Press the START key and wait for the acquisition to be complete; make sure that SLOW CLOCK is not
displayed on the CRT.
4. Press the DATA key until the STATE TABLE is displayed; check that the data acquired is equal to the
Expected Data given in Table 5-18.
Table 5-18
338 VOLTAGE LEVELS FOR TESTING TTL
Power Supply
Pulse Generator
Threshold Level
Expected
Output (V)
High (V) Low (V)
V1 (V) V2 (V) V3 (V)
Data
+1.65
+1.65 +1.15
------ ------ ------
all Fs (hex)
+1.15
+1.65 +1.15
------ ------ ------
all Os
THRESHOLD LEVELS V1, V2, AND V3
1. Press the THRESHOLD key.
2. Set the power supply output level, the pulse generator output level, and the Threshold V1, V2, EXT CLK, and
Pods A through D levels as shown in Table 5-19.
3. Press the 338 DATA key.
4. Press the START key and wait for the acquisition to be completed; make sure that SLOW CLOCK is not
displayed on the CRT.
5. Check to make sure the data acquired is equal to the Expected Data given in Table 5-19.
6. Set the 338 SRCH WORD to equal the Expected Data and then check that the quantity of SRCH words equal
256.
7. Repeat Steps (1) to (6) for each test in Table 5-19.
5-101
Summary of Contents for 318
Page 119: ...318 VERIFICATION AND ADJUSTMENT PROCEDURES ...
Page 182: ...338 VERIFICATION AND ADJUSTMENT PROCEDURES ...
Page 253: ...318 ___________________ TROUBLESHOOTING TREES ...
Page 344: ...338 TROUBLESHOOTING TREES ...
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Page 518: ...TM 11 6625 3145 14 318 338 4434 924 338 Block Diagram ...
Page 519: ...TM 11 6625 3145 14 318 338 4434 925 318 Acquisition Module Wiring Diagram ...
Page 520: ...TM 11 6625 3145 14 318 338 4434 926 318 338 Mainframe Wiring Diagram ...
Page 521: ...TM 11 6625 3145 14 318 338 4434 926 338 Acquisition Module Wiring Diagram ...
Page 522: ...TM 11 6625 3145 14 318 338 4434 928 Figure 9 1 318 A01 Input A Board Component Locations ...
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Page 542: ...TM 11 6625 3145 14 Figure 9 8 318 338 A10 CRT Board Component Locations ...
Page 544: ...TM 11 6625 3145 14 Figure 9 9 318 338 A11 Inverter Board component Locations ...
Page 546: ...TM 11 6625 3145 14 Figure 9 10 318 338 A12 Regulator Board Component Locations ...
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Page 553: ...TM 11 6625 3145 14 318 338 SERVICE ...
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