TM 11-6625-3145-14
TABLE OF CONTENTS (cont.)
OPERATING INSTRUCTIONS (cont.)
DIAGNOSTICS ....................................................................................................................................... 3-5
Power-Up Self Test ........................................................................................................................ 3-5
Diagnostics Menu ........................................................................................................................... 3-6
User-Changeable Fields for Each Test’s Display........................................................................... 3-6
Diagnostic Test Descriptions.......................................................................................................... 3-8
KBD Test ................................................................................................................................ 3-8
CRT Test ................................................................................................................................ 3-8
CLK Test .............................................................................................................................. 3-10
WR Test ............................................................................................................................... 3-10
ACQ Test.............................................................................................................................. 3-11
SQRAM Test ........................................................................................................................ 3-11
N&DLY Test ......................................................................................................................... 3-12
SEQ Test.............................................................................................................................. 3-12
THRSH Test ......................................................................................................................... 3-13
External Clock Probe Compensation ................................................................................... 3-13
P6107 Probe Assignment and Compensation for the
318S1 and 338S1 ........................................................................................................ 3-14
SER Test .............................................................................................................................. 3-15
RMT Test ............................................................................................................................. 3-16
NVM Test ............................................................................................................................. 3-17
THEORY OF OPERATION
SECTION ORGANIZATION ................................................................................................................... 4-1
DIGITAL LOGIC CONVENTIONS .......................................................................................................... 4-1
GENERAL SYSTEM DESCRIPTION ..................................................................................................... 4-1
Acquisition Module.................................................................................................................................. 4-2
Parallel Data Inputs (A01 AND A02) .............................................................................................. 4-2
P6451 Parallel Data Probe..................................................................................................... 4-2
P6107 External Clock Probe .................................................................................................. 4-2
Data Buffers, Delay Lines, and First Lactches ....................................................................... 4-3
External Clock Circuit ............................................................................................................. 4-3
Clock Selector ........................................................................................................................ 4-3
Word Recognizer ................................................................................................................... 4-3
Threshold Circuit .................................................................................................................... 4-3
Acquisition Control Board (A03) ............................................................................................................. 4-3
Qualifier Selector.................................................................................................................... 4-3
Strobe Generator.................................................................................................................... 4-3
Trigger Sequencer.................................................................................................................. 4-3
Event/Delay Counter .............................................................................................................. 4-3
Acquisition Memory Board (A04).................................................................................................... 4-3
100 MHz Oscillator ................................................................................................................. 4-3
Sampled Data RAM and Glitch RAM ..................................................................................... 4-3
Acquisition Address Counter and Carry Flag F-F................................................................... 4-3
Output Multiplexer .................................................................................................................. 4-3
v
Summary of Contents for 318
Page 119: ...318 VERIFICATION AND ADJUSTMENT PROCEDURES ...
Page 182: ...338 VERIFICATION AND ADJUSTMENT PROCEDURES ...
Page 253: ...318 ___________________ TROUBLESHOOTING TREES ...
Page 344: ...338 TROUBLESHOOTING TREES ...
Page 517: ...TM 11 6625 3145 14 318 338 4434 923 318 Block Diagram ...
Page 518: ...TM 11 6625 3145 14 318 338 4434 924 338 Block Diagram ...
Page 519: ...TM 11 6625 3145 14 318 338 4434 925 318 Acquisition Module Wiring Diagram ...
Page 520: ...TM 11 6625 3145 14 318 338 4434 926 318 338 Mainframe Wiring Diagram ...
Page 521: ...TM 11 6625 3145 14 318 338 4434 926 338 Acquisition Module Wiring Diagram ...
Page 522: ...TM 11 6625 3145 14 318 338 4434 928 Figure 9 1 318 A01 Input A Board Component Locations ...
Page 526: ...TM 11 6625 3145 14 ...
Page 528: ...TM 11 6625 3145 14 Figure 9 3 318 338 A03 ACQ Control Board Component Locations ...
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Page 542: ...TM 11 6625 3145 14 Figure 9 8 318 338 A10 CRT Board Component Locations ...
Page 544: ...TM 11 6625 3145 14 Figure 9 9 318 338 A11 Inverter Board component Locations ...
Page 546: ...TM 11 6625 3145 14 Figure 9 10 318 338 A12 Regulator Board Component Locations ...
Page 551: ...TM 11 6625 3145 14 Figure 9 12 338 A01 Input A Board Component Locations ...
Page 553: ...TM 11 6625 3145 14 318 338 SERVICE ...
Page 554: ......
Page 555: ...PIN 058584 ...