Index
IX-9
S
SACK
SACs
SCLK
quadrupler enable (QEN)
quadrupler select (QSEL)
scratch
byte register (SBR)
register A (SCRATCHA)
register B (SCRATCHB)
registers C–R (SCRATCHC–SCRATCHR)
script fetch selector (SFS)
SCRIPTS
instruction
interrupt instruction received (SIR)
,
processor
internal RAM for instruction storage
performance
RAM
running (SRUN)
SCSI
ATN condition - target mode (M/A)
bit mode change (SBMC)
bus control lines (SBCL)
bus data lines (SBDL)
bus interface
,
bus mode change (SBMC)
byte count (SBC)
C_D/ signal (C_D)
chip ID (SCID)
clock (SCLK)
control enable (SCE)
control one (SCNTL1)
control three (SCNTL3)
control two (SCNTL2)
control zero (SCNTL0)
cumulative byte count
data high impedance (ZSD)
destination ID (SDID)
disconnect unexpected (SDU)
encoded destination ID
FIFO test read (STR)
FIFO test write (STW)
first byte received (SFBR)
function A control
function A GPIO signals
function A signals
function B control
function B GPIO signals
function B signals
functional description
gross error (SGE)
hysteresis of receivers
I_O/ signal (I/O)
input data latch (SIDL)
input filtering
instructions
block move
I/O
read/write
interface signals
interrupt enable one (SIEN1)
,
interrupt enable zero (SIEN0)
,
interrupt pending (SIP)
interrupt status one (SIST1)
,
interrupt status zero (SIST0)
,
interrupts
isolation mode (ISO)
longitudinal parity (SLPAR)
loopback mode (SLB)
low level mode (LOW)
LVDlink
mode (SMODE[1:0])
MSG/ signal (MSG)
output control latch (SOCL)
output data latch (SODL)
,
parity control
parity error (PAR)
parity errors and interrupts
performance
phase
phase mismatch - initiator mode
registers
reset condition (RST)
RST/ received (RST)
RST/ signal (RST)
SCRIPTS operation
sample instruction
SDP0/ parity signal (SDP0)
SDP1/ parity signal (SDP1)
selected as ID (SSAID)
selector ID (SSID)
serial EEPROM access
status one (SSTAT1)
status two (SSTAT2)
status zero (SSTAT0)
synchronous offset maximum (SOM)
synchronous offset zero (SOZ)
synchronous transfer period (TP[2:0])
termination
test four (STEST4)
test one (STEST1)
test three (STEST3)
test two (STEST2)
,
test zero (STEST0)
timer one (STIME1)
timer zero (STIME0)
timing diagrams
TolerANT technology
transfer (SXFER)
,
true end of process
Ultra2 SCSI
valid (VAL)
wide residue (SWIDE)
,
SCSI high impedance mode (SZM)
SCSI-1
transfers
(differential 4.17 Mbytes)
(single-ended 5.0 Mbytes)
SCSI-2
fast transfers
10.0 Mbytes (8-bit transfers)
40 MHz Clock
50 MHz Clock
20.0 Mbytes (16-bit transfers)
40 MHz Clock
50 MHz Clock
second dword
,
,
select
during selection
*
Summary of Contents for LSI53C896
Page 6: ...vi Preface...
Page 16: ...xvi Contents...
Page 88: ...2 62 Functional Description...
Page 112: ...3 24 Signal Descriptions...
Page 306: ...6 38 Specifications This page intentionally left blank...
Page 310: ...6 42 Specifications This page intentionally left blank...
Page 338: ...6 70 Specifications Figure 6 40 LSI53C896 329 BGA Bottom View...
Page 340: ...6 72 Specifications...
Page 346: ...A 6 Register Summary...
Page 362: ...IX 12 Index...