372 User Manual
1Ć1
Overview
The Sony/Tektronix 372 Semiconductor Workbench is a versatile, highĆpreciĆ
sion, fully programmable digitalĆstorage semiconductor workbench that can
be used to measure, analyze and graphically display the DC characteristics
of a wide range of semiconductor devices including FETs (Field Effect TranĆ
sistors), BJTs (Bipolar Junction Transistors), diodes and ICs.
Measurement Units
The 372's measurement circuit consists of two Source/Measure Units
(SMUs):the High Power Unit (HPU) and the Low Power Unit (LPU), and a
Ground Unit (GNDU). The SMUs supply a regulated current or voltage and
measure the response current and/or voltage. The GNDU provides zero
potential. The SMUs are separated from protective ground by a floating
chassis which allows for floating measurements.
The HPU supplies the DUT (Device Under Test) with 0 to ±200 volts, or 0 to
400 mA current. The LPU supplies the DUT with 0 to ±100 volts, or 0 to100
mA current. Both SMUs are equipped with monitoring features that can
deliver very small currents at a resolution of 25 fA at a current range of 100
pA.
The SMUs are provided with compliance and RĆmode (Protective ResisĆ
tance) to protect the 372 and the DUT from overcurrent, overvoltage and
oscillation.
Measurement Configuration
The 372 is equipped with an internal matrix switch which allows you to
configure combinations of SMUs, GNDU and DUT, and to measure key
parameters of the DUT such as breakdown voltage, leakage current, beta,
etc.
The instrument has a Catalog Setup feature that allows easy configuration
for measurement of the main parameters (ID vs. VDS, IDSS vs. VDS, IC vs.
VBE, IB vs. VCE, etc.) of FETs, BJTs and diodes. In addition, you can configĆ
ure the 372 for measurement of 2 to 4Ćlead semiconductor device characterĆ
istics.
Auxiliary Voltage Supply Unit
The 372 is provided with two auxiliary supply units in addition to the HPU
and LPU. Maximum power output is ±40 V at 100 mA. These units can be
used for various purposes such as supplying a bias to the DUT.
Product Description
Summary of Contents for 372
Page 4: ......
Page 6: ...About this Manual ii ...
Page 14: ...Contents x ...
Page 22: ...Contents xviii ...
Page 30: ...Consignes de Sécurité Safety Summary xxvi ...
Page 31: ...Getting Started ...
Page 32: ......
Page 36: ...Overview Getting Started 1Ć4 ...
Page 90: ...Tutorial Ć About the Sample Disk Getting Started 1Ć58 ...
Page 91: ...Operating Basics ...
Page 92: ......
Page 108: ...Mounting the Device Under Test Operating Basics 2Ć16 ...
Page 110: ...Before and After Floating Measurement Operating Basics 2Ć18 ...
Page 111: ...Reference ...
Page 112: ......
Page 174: ...Pulse Mode Reference 3Ć62 ...
Page 176: ...Auxiliary Voltage Supply Reference 3Ć64 ...
Page 186: ...Adjusting the Graph Display Reference 3Ć74 ...
Page 190: ...Mathematical Operation Reference 3Ć78 ...
Page 210: ...Zoom Reference 3Ć98 ...
Page 217: ...Text Editing on the Graph 372 User Manual 3Ć105 Figure 3Ć46 ăClear Labels PopĆup Menu ...
Page 218: ...Text Editing on the Graph Reference 3Ć106 ...
Page 228: ...Hardcopy Reference 3Ć116 ...
Page 230: ...Initializing the 372 Reference 3Ć118 ...
Page 234: ...Time Stamp Reference 3Ć122 ...
Page 236: ...Adjusting CRT Brightness Reference 3Ć124 ...
Page 238: ...ID Information Reference 3Ć126 ...
Page 254: ...Floppy Disk System Reference 3Ć142 ...
Page 280: ...Sample Programs Reference 3Ć168 ...
Page 286: ...GPIB Reference 3Ć174 ...
Page 287: ...Appendices ...
Page 288: ......
Page 292: ...Appendix B Specifications Appendices AĆ4 ...
Page 312: ...Appendix B Specifications Appendices AĆ24 ...
Page 358: ...Appendix B Specifications Appendices AĆ70 ...