Measurement
372 User Manual
3Ć67
Figure 3Ć26:ăSETUP Application Menu
By touching the [SETUP] box in the application selection box in the applicaĆ
tion section of the MEASURE menu, the SETUP application menu appears
allowing you to access the setup feature (see Figure 3Ć26).
The [PULSE] soft button and selector settings for the acquisition, averaging
and source setups of the HPU and LPU in the CONFIG menu are also disĆ
played in the SETUP application menu which consists of two display pages
that can be switched by the [GOTO] soft button in the lowerĆleft part of the
SETUP application menu.
Selectors and their settings displayed in the SETUP application menu deĆ
pend on the settings in the Operation Mode Setup section of the CONFIG
menu, as in the case of Source Setup section in the CONFIG menu. Refer to
Averaging, Acquisition Parameters and Source Setup in Setups of this
section, for settings and operations.
Below is an example of how to make dynamic changes. Let's suppose that
the IC vs. VCE characteristic measurement of BJT or the ID vs. VDS characĆ
teristic measurement is in progress, the MEASURE menu is currently disĆ
played, and curves measured are repeatedly displayed on the graph.
ăStep 1:ă
Touch the [SETUP] box in the application selection box to
display the SETUP application menu in the MEASURE menu.
ăStep 2:ă
Observe how the curves being measured are effected when the
stop value of the HPU (master source unit) is being changed as follows:
H
Make sure that the [STOP] selector of the HPU is currently displayed
on the menu. If it is not, switch the page by touching the [GOTO]
soft button.
Summary of Contents for 372
Page 4: ......
Page 6: ...About this Manual ii ...
Page 14: ...Contents x ...
Page 22: ...Contents xviii ...
Page 30: ...Consignes de Sécurité Safety Summary xxvi ...
Page 31: ...Getting Started ...
Page 32: ......
Page 36: ...Overview Getting Started 1Ć4 ...
Page 90: ...Tutorial Ć About the Sample Disk Getting Started 1Ć58 ...
Page 91: ...Operating Basics ...
Page 92: ......
Page 108: ...Mounting the Device Under Test Operating Basics 2Ć16 ...
Page 110: ...Before and After Floating Measurement Operating Basics 2Ć18 ...
Page 111: ...Reference ...
Page 112: ......
Page 174: ...Pulse Mode Reference 3Ć62 ...
Page 176: ...Auxiliary Voltage Supply Reference 3Ć64 ...
Page 186: ...Adjusting the Graph Display Reference 3Ć74 ...
Page 190: ...Mathematical Operation Reference 3Ć78 ...
Page 210: ...Zoom Reference 3Ć98 ...
Page 217: ...Text Editing on the Graph 372 User Manual 3Ć105 Figure 3Ć46 ăClear Labels PopĆup Menu ...
Page 218: ...Text Editing on the Graph Reference 3Ć106 ...
Page 228: ...Hardcopy Reference 3Ć116 ...
Page 230: ...Initializing the 372 Reference 3Ć118 ...
Page 234: ...Time Stamp Reference 3Ć122 ...
Page 236: ...Adjusting CRT Brightness Reference 3Ć124 ...
Page 238: ...ID Information Reference 3Ć126 ...
Page 254: ...Floppy Disk System Reference 3Ć142 ...
Page 280: ...Sample Programs Reference 3Ć168 ...
Page 286: ...GPIB Reference 3Ć174 ...
Page 287: ...Appendices ...
Page 288: ......
Page 292: ...Appendix B Specifications Appendices AĆ4 ...
Page 312: ...Appendix B Specifications Appendices AĆ24 ...
Page 358: ...Appendix B Specifications Appendices AĆ70 ...