Tutorial - The Measurement Process
372 User Manual
1Ć15
ăStep 5:ă
Close the protective cover.
When the part has been mounted, close the protective cover of the test
fixture. The 372 is equipped with a safety interlock system so that a meaĆ
surement cannot be made unless the test fixture cover is closed.
Setups
Immediately after the CONFIG menu shown in Figure 1Ć8 is displayed on the
CRT, a setup can be done. In this menu, the DUT and the SMUs are configĆ
ured (i.e. the simplified circuit indicated in Figure 1Ć7 is configured). Next,
the acquisition parameters and the source setup values for each SMU are
set.
Configuration with CATALOG Setups
The configuration can automatically be made for the specific measurement
by using the catalog setup feature. The default parameter values for the
acquisition and the source setup for each SMU are also set each time the
catalog setup is performed, so that you can easily step to the measurement
stage by modifying some parameter values as needed.
ăStep 6:ă
Configure the 372 using the catalog setup menu (See Figure
1Ć10)
H
Touch the [CATALOG] soft button located in upperĆright corner of
the CONFIG menu to display the Catalog Setup menu.
H
Touch the [FET_N] box in the Device Type selection box to display
the corresponding Test Item selection box for FET on the right side
of the Device Type selection box.
H
Touch the [ID vs. VDS] box in the Test Item selection box.
The [ID vs. VDS] box is the default test item highlighted, so you can
omit this step and proceed unless another box is selected.
H
Touch the [EXECUTE] soft button to return the CONFIG menu to the
CRT.
Summary of Contents for 372
Page 4: ......
Page 6: ...About this Manual ii ...
Page 14: ...Contents x ...
Page 22: ...Contents xviii ...
Page 30: ...Consignes de Sécurité Safety Summary xxvi ...
Page 31: ...Getting Started ...
Page 32: ......
Page 36: ...Overview Getting Started 1Ć4 ...
Page 90: ...Tutorial Ć About the Sample Disk Getting Started 1Ć58 ...
Page 91: ...Operating Basics ...
Page 92: ......
Page 108: ...Mounting the Device Under Test Operating Basics 2Ć16 ...
Page 110: ...Before and After Floating Measurement Operating Basics 2Ć18 ...
Page 111: ...Reference ...
Page 112: ......
Page 174: ...Pulse Mode Reference 3Ć62 ...
Page 176: ...Auxiliary Voltage Supply Reference 3Ć64 ...
Page 186: ...Adjusting the Graph Display Reference 3Ć74 ...
Page 190: ...Mathematical Operation Reference 3Ć78 ...
Page 210: ...Zoom Reference 3Ć98 ...
Page 217: ...Text Editing on the Graph 372 User Manual 3Ć105 Figure 3Ć46 ăClear Labels PopĆup Menu ...
Page 218: ...Text Editing on the Graph Reference 3Ć106 ...
Page 228: ...Hardcopy Reference 3Ć116 ...
Page 230: ...Initializing the 372 Reference 3Ć118 ...
Page 234: ...Time Stamp Reference 3Ć122 ...
Page 236: ...Adjusting CRT Brightness Reference 3Ć124 ...
Page 238: ...ID Information Reference 3Ć126 ...
Page 254: ...Floppy Disk System Reference 3Ć142 ...
Page 280: ...Sample Programs Reference 3Ć168 ...
Page 286: ...GPIB Reference 3Ć174 ...
Page 287: ...Appendices ...
Page 288: ......
Page 292: ...Appendix B Specifications Appendices AĆ4 ...
Page 312: ...Appendix B Specifications Appendices AĆ24 ...
Page 358: ...Appendix B Specifications Appendices AĆ70 ...