Measurement System
372 User Manual
3Ć27
In addition to the start, stop and increment parameters of the master source,
the offset parameter for linear sweep and the ratio parameter for log sweep
can be given to the slave source in sync mode.
The delay time and hold time can be given to eliminate effects caused by
delay characteristics in the rise time and fall time of stepped output from the
DUT (see Figure 3Ć7).
Time Domain Measurement Mode
The 372 also performs time domain measurements that measure voltage or
current changes vs. time. A constant voltage and current can be applied to
the DUT, or they can be changed after a specified length of time. You must
give the following parameters in time domain measurement mode:
Stop Value
Hold Time
Time
Sampling Interval
Start Value
Figure 3Ć8:ăVoltage or Current Changes vs. Time
H
Start - The voltage or current at which measurement starts.
H
Stop - The voltage or current set in the hold time after measurement
starts.
H
Hold Time - The time length that the START value is maintained after
measurement begins. The voltage or current value is changed from the
START value to the STOP value at the time when the HOLD TIME arĆ
rives.
H
Sampling Interval - Measurement sampling interval.
Averaging
The averaging feature can be used to minimize random fluctuations in the
measurement results. The four averaging modes are available:
H
OFF - Measurement is performed once, with no averaging.
H
4 - Each point is measured four times with the average taken as the
final value.
H
32 - Each point is measured 32 times with the average taken as the
final value.
Summary of Contents for 372
Page 4: ......
Page 6: ...About this Manual ii ...
Page 14: ...Contents x ...
Page 22: ...Contents xviii ...
Page 30: ...Consignes de Sécurité Safety Summary xxvi ...
Page 31: ...Getting Started ...
Page 32: ......
Page 36: ...Overview Getting Started 1Ć4 ...
Page 90: ...Tutorial Ć About the Sample Disk Getting Started 1Ć58 ...
Page 91: ...Operating Basics ...
Page 92: ......
Page 108: ...Mounting the Device Under Test Operating Basics 2Ć16 ...
Page 110: ...Before and After Floating Measurement Operating Basics 2Ć18 ...
Page 111: ...Reference ...
Page 112: ......
Page 174: ...Pulse Mode Reference 3Ć62 ...
Page 176: ...Auxiliary Voltage Supply Reference 3Ć64 ...
Page 186: ...Adjusting the Graph Display Reference 3Ć74 ...
Page 190: ...Mathematical Operation Reference 3Ć78 ...
Page 210: ...Zoom Reference 3Ć98 ...
Page 217: ...Text Editing on the Graph 372 User Manual 3Ć105 Figure 3Ć46 ăClear Labels PopĆup Menu ...
Page 218: ...Text Editing on the Graph Reference 3Ć106 ...
Page 228: ...Hardcopy Reference 3Ć116 ...
Page 230: ...Initializing the 372 Reference 3Ć118 ...
Page 234: ...Time Stamp Reference 3Ć122 ...
Page 236: ...Adjusting CRT Brightness Reference 3Ć124 ...
Page 238: ...ID Information Reference 3Ć126 ...
Page 254: ...Floppy Disk System Reference 3Ć142 ...
Page 280: ...Sample Programs Reference 3Ć168 ...
Page 286: ...GPIB Reference 3Ć174 ...
Page 287: ...Appendices ...
Page 288: ......
Page 292: ...Appendix B Specifications Appendices AĆ4 ...
Page 312: ...Appendix B Specifications Appendices AĆ24 ...
Page 358: ...Appendix B Specifications Appendices AĆ70 ...