Tektronix 372, User Manual, Page: 43 / 364

372 User Manual
1Ć11
Tutorial
This section provides exercises designed to acquaint you with the features
and operation of the 372. Four exercises are described below, but it is not
necessary to perform all of them. When the fundamental operation methods
are understood, you can try various operations on your own.
H Example 1 - describes how to measure the ID vs. VDS characteristic
curve of a common source FET throughout the entire process of powerĆ
up, mounting the Device Under Test, configuration and setting parameĆ
ters using the catalog setup feature, measurement, analysis using the
cursor feature, and saving settings.
H Example 2 - explains two other ways of setups:setups without the
catalog setup feature using Example 1, and recalling setups from the
floppy disk.
H Example 3 - explains how to use cursor feature to measure semiconĆ
ductor parameters. Examples for a BJT, FET and DIODE are given.
H Example 4 - describes how to setup and measure in time domain
measurement.
A sample floppy disk with setup and program examples, GPIB programming
examples, and sample devices (016Ć1216Ć00) including:
1. 1 N channel FET 2N4932
2. 1 NPN type BJT 2N3904
3. 1 Zener diode RD9.1E
are provided with this manual. Use these devices and/or setup examples,
the four exercises mentioned above. The setup and program files on the
sample disk are described in About the Sample Floppy Disk in this Tutorial.
The examples are not intended to give you a complete inventory of every
feature of the instrument. Basic concepts of the measurement system,
measurement methods, floppy disk file system, and programming feature,
are described in Section 2. The details of the operating procedures for each
feature are explained in Section 3 and 4. Refer to these sections when you
encounter any specific questions while performing the operations.
Before proceeding with the exercises, confirm that the installation has been
completed according to Start Up in the previous chapter.
Introduction