Figure 11-7. Recommended Screening Procedure
If a series of write errors occurs while the same PROM writer is in use, stop programming and
check the PROM writer and socket adapter for defects, using a microcomputer chip with a
windowed package and on-chip EPROM.
Please inform Hitachi of any abnormal conditions noted during programming or in screening of
program data after high-temperature baking.
11.3.4 Erasing of Data
The windowed package enables data to be erased by illuminating the window with ultraviolet light.
Table 11-7 lists the erasing conditions.
Table 11-7. Erasing Conditions
Item
Value
Ultraviolet wavelength
253.7 nm
Minimum illumination
15W·s/cm
2
The conditions in table 11-7 can be satisfied by placing a 12000µW/cm
2
ultraviolet lamp 2 or 3
centimeters directly above the chip and leaving it on for about 20 minutes.
Write and verify program
Read and check program
V
CC
= 4.5V and 5.5V
Install
Note:
*
Baking time should be measured from the point when the baking oven reaches 150°C.
Bake with power off
150° ± 10°C, 48 Hr + 8 Hr
*
– 0 Hr
237
Summary of Contents for H8/326 Series
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