Hioki BT5525, Instruction Manual, Page: 203 / 215

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Influence of Capacitive Load
11.3 Influence of Capacitive Load
Pure resistance is assumed in the specifications of this instrument, however, the DUT contains
considerable amount of capacitance. As a result of connecting a capacitive load, a greater
inconsistency is found in the test data as the resistance is higher (small detection current) in
general.
Influence on output voltage rise
The charging current can be set in the range between 50 µA and 50 mA.
When a capacitive load, such as a capacitor, is connected, the time required for the output voltage
to rise is affected. The time required can be calculated as follows.
Output voltage rising time (s) = Capacitance value (F)
×
test voltage (V) / current limit value (A)
Example
When a voltage is applied to a 0.1 µF capacitor at a test voltage of 500 V and current limit value of
2 mA, the time required for the voltage to rise to 500 V after the test starts is calculated as follows
and is approximately 25 ms.
(0.1 µF
×
500 V) / 2 mA
IMPORTANT
• Depending on the DUT’s capacitance component, the actual rising time may exceed the time
calculated using the above equation. Set a sufficiently long test time.
• If a capacitive load of approximately 50 μF or more is connected while using a current limit
value of 5.1 mA or more, constraints related to the output generator will result in an error,
making measurement impossible.
See “9.2 Input, Output, and Measurement Specifications” (p. 180)
Appendix
HIOKI BT5525A961-00