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182
Input, Output, and Measurement Specifications
Functional specifications
(1) Contact check function
Detection method
Two-terminal electrostatic capacitance measurement method
Operation
Executed one time before measurement starts (before output voltage is applied).
Detection signal
Sine wave having a frequency of either 437 Hz or 3496 Hz and a peak-to-peak voltage
of 300 mV
Capacitance measurable
range
100 pF to 200 nF
Capacitance
measurement accuracy
range
1 nF to 100 nF
Capacitance
measurement accuracy
Within a range of 35% of reading plus 0.1 nF in either direction
Judgment reference
value setting range
100 pF to 100 nF
Judgment
PASS: Capacitance measured value ≥ Judgment reference value
FAIL: Judgment reference value > Capacitance measured value
See “5.1 Checking for Any Contact Defects and Confirming Contact Condition (Contact Check Function)”
(2) Current limit function
Setting range
50 μA to 50 mA
Set resolution
50 μA to 990 μA:
10 μA
1.0 mA to 50.0 mA: 0.1 mA
Output accuracy
Within a range of 20% of setting plus 10 μA in either direction
Functional
specifications
MANUAL
Limits current to the set value.
AUTO
Current limit values are set automatically based on the desired
DUT charging time and the DUT’s capacitance. (Current limit
values are not covered by the accuracy guarantee.)
Constraints
Current is limited to the following setting values once the voltage reaches set value:
50 μA to 5.0 mA:
Set value
5.1 mA to 50.0 mA: 5 mA
See “5.3 Limiting the Current to Be Applied to the Device Under Test (DUT)” (p. 64).
(3) Break Down Detect (BDD) function
Operations
Charging (CC)
Determines any variable voltage value as a judgment value.
When the measured value exceeds the judgment value range, a
FAIL judgment is given.
Steady state (CV)
Determines a judgment value as a percentage (%) of the set
voltage value and current value.
When the measured value exceeds the judgment value range, a
FAIL judgment is given.
Judgment value range
Charging (CC V)
0.1 V to 500.0 V
Steady state (CV V) 0.1 V to 500.0 V
Steady state (CV I)
0.6% to 999.9%
See “5.2 Detecting Micro Insulation Failure (BDD Function)” (p. 60).
HIOKI BT5525A961-00
Summary of Contents for BT5525
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Page 6: ...Contents 6 HIOKI BT5525A961 00 ...
Page 48: ...48 Notifying the Judgment Result and Test Completion with a Beep HIOKI BT5525A961 00 ...
Page 76: ...76 Initializing the Instrument Reset HIOKI BT5525A961 00 ...
Page 82: ...82 Deleting Panel Data HIOKI BT5525A961 00 ...
Page 200: ...200 License Information HIOKI BT5525A961 00 ...
Page 215: ...www hioki com HIOKI BT5525A961 00 ...