System and Peripheral Control Registers
142
SPNU503C – March 2018
Copyright © 2018, Texas Instruments Incorporated
Architecture
2.5.1.20 Memory Self-Test Global Control Register (MSTGCR)
The MSTGCR register, shown in
and described in
, controls several aspects of the
PBIST (Programmable Built-In Self Test) memory controller.
Figure 2-25. Memory Self-Test Global Control Register (MSTGCR) [offset = 58h]
31
16
Reserved
R-0
15
10
9
8
7
4
3
0
Reserved
ROM_DIV
Reserved
MSTGENA
R-0
R/WP-0
R-0
R/WP-5h
LEGEND: R = Read only; R/W = Read/Write; WP = Write in privileged mode only; -
n
= value after reset
Table 2-39. Memory Self-Test Global Control Register (MSTGCR) Field Descriptions
Bit
Field
Value
Description
31-10
Reserved
0
Reads return 0. Writes have no effect.
9-8
ROM_DIV
Prescaler divider bits for ROM clock source.
0
ROM clock source is HCLK divided by 1. PBIST will reset for 16 VBUS cycles.
1h
ROM clock source is HCLK divided by 2. PBIST will reset for 32 VBUS cycles.
2h
ROM clock source is HCLK divided by 4. PBIST will reset for 64 VBUS cycles.
3h
ROM clock source is HCLK divided by 8. PBIST will reset for 96 VBUS cycles.
7-4
Reserved
0
Reads return 0. Writes have no effect.
3-0
MSTGENA
Memory self-test controller global enable key
Note: Enabling the MSTGENA key will generate a reset to the state machine of the
selected PBIST controller.
Ah
Memory self-test controller is enabled.
All other values
Memory self-test controller is disabled.
Note: It is recommended that a value of 0101b be used to disable the memory self-test
controller. This value will give maximum protection from a bit flip inducing event that
would inadvertently enable the controller.