HP 3562A, Service Manual

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) E L 3562A FAU LT I SO LAT ION
SOURCE MA I N
This key in itiates the Digital Sou rce Self Test. The A2 System C PU loads the A1
Digital Sou rce with test data to test most of the d igital sou rce's su bblocks. The:
system CPU then reads the contents of the digital sou rce's status registers. Failed
bits of the status registers are entered in the test log. (Refer to 8-5)
ZOOM
This key initiates the Zoom Test. A zoomed measurement is done using a test signal
from the A30 Analog Source. If this test passes, the A30 Analog Source main output,
A4 LO, AS Digital Filter, A6 Dig ital Fi lter Contro l ler, A7 FPP, A9 FFT, and the A8
G lobal RAM are verified.
LO FU NCTN
This key in itiates the LO Functional test. This test causes the LO to output phase
and sine values to the A2 System CPU. The system CPU then com pares the values
to known good values. This test first executes using external clocks (SYNC2 and
10 MHz) and then runs again su bstituting internal clocks for the SYNC2 and 10 MHz
clocks. (Refer to 8-8)
LO DSA PATT 1
This key is used i n the A4 Local Osci llator signature analysis tests. (Refer to 8-8)
LO DSA PATT2
This key is used i n the A4 Local Osci llator signature analysis tests. (Refer to 8-8)
TEST I N P UT
This key d isplays the menu of soft keys used in testing and adjusting the A30 Analog Sou rce,
A32, A34 Analog Digital Converter and the A33, A3S I nput assembl ies.
FR E N D ADJ U ST
ADC
This key displays the menu of soft keys used i n testing the A32, A34 Analog D igital
Converter. The AS Digital Filter status words are displayed when DI GTAL TRAC E ,
PASS TH RU, o r S ECOND PASS keys are pressed.
FR E N D FU NCTN
The FR E N D FU NCTN key is used to test the A30 Analog Source (includ ing
the cal ibrator), the A32, A34 ADCs, and the A33, A3S Inputs. This test enables
the analog sou rce output and then the cal ibrator output i nto the i n put
channels. The resu lts are compared to known values. This test is the same
test as the Sou rce Test (SOU RC E FU NCTN).