FAU LT I SO LAT I O N
MOD E L 3562A
7-1 8
7-7 TEST ALL
Introduction
The Test A l l sequence thoroughly exercises the d igital and the analog hardware in the
i nstru ment. This self-d iagnostic actually does several types of measurements to determ ine
what is operating correctly. When a fault is found the self-d iagnostic exercises suspected
circu its using digital signals generated internal ly, read ing status registers, and using the
i nternal analog sou rce and calibrator. The Test Al l sequence then uses logic to determ ine
the m ost l i kely fai l u re based on the resu lts of these measu rements.
A l l fai l u re messages are displayed in the Test Log (refer to 7-1 5 for test log description).
I f the Test A l l sequence does not isolate the defective assembly, the individual self-tests
for the suspected assembl ies can be done individually to help isolate the fail ure. Use table
7-6 as a reference when ru nning any of the service tests. When a test passes the assembl ies
and subblocks exercised are most l i kely operating correctly.
The Test A l l featu re does not isolate fai l u res on the fol lowing assembl ies:
Core Assembl ies
A32 Trigger
A 1 5 Keyboard
A1 8 Power Supply
A 1 2 Mother Board
A1 7 Display I nterface
H P 1 345A Display
System and global control lines
I f a keyboard related prob lem is suspected, go to 8-1 5 after perform ing TEST ALL. If the
i ns trument does not respond when a key is pressed or the display is defective, go to
paragraph 7-5, " I n itial Cond itions Test". The Test A l l diagnostic does not use or test the
fol lowing circu its:
A22 H P I B (refer to 8-6 for H P-i S fai l u res)
.
sou rce c i rcu its re er to 7-9 for bu rst and noise fai l u res)
Fol low the Test A l l proced u re starting with part A to isolate the fai l u re.
Test All Procedure
A. Start
1 . Press the l ine switch on.
Summary of Contents for 3562A
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Page 305: ...c c I O Sequencer S r J Sequence Decoder ...
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