MO D E L 3562A
FAU LT I SO LAT ION
7-58
7-1 6 DIAGNOSTIC DESCRIPTIONS
The self-tests consist of approxi mately 40 d ifferent tests that are run either in groups o r
individually to test a particular assembly, a function, or the entire instrument. The power-up
tests are executed on tu rn-on, and the rest of the self-tests are invoked by pressing soft
keys. This section describes the sequence of tests executed in groups and the S E RV I C
T E ST soft key tests. Refer to tab le 7-4, "Power-up Test Codes" and table 7-6, "TEST ALL
Messages" for a general description of the test resu lt messages. For a detailed explanation
of test resu lt messages, refer to the trou bleshooting paragraph for the assembly failing.
A.
Power-Up Tests
The power-u p tests consist of two sets of tests, low-level and high-level. The low-level
tests exercise the A2 System CPU, the A3 Program ROM, the A8 G lobal RAM, the global
bus, and the system bus. Fau lt and pass codes for these assembl ies are d isplayed using
the A2 System CPU test LEDs (A2 DS3, A2 DS4). The high-level tests exercise the A9 FFT,
A7 FPP, AS DGTL FLTR, and A6 D FL TR CONT assemblies. Fau lts on these assembl ies
are displayed in the test log. The instru ment performs a cal ibration if the power-u p tests
pass. Refer to figure 7-1 2 for the power-u p sequence.
Summary of Contents for 3562A
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