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25 PowerBJT
25.8
Ic-Ib for Expanders (A.05.03)
[Supported Analyzer]
B1505A
[Description]
Gummel-Plot measurement by using UHCU, HVMCU and UHVU while the voltage drop at the output
resistance of expanders is compensated to make Vce constant.
[Device Under Test]
Power BJT, 3 terminals
[Device Parameters]
Polarity: NPN (SMUs force the specified value) or PNP (SMUs force the negative specified value).
Y1AxisIcMin: Y1 axis (Ic) minimum value
Y1AxisIcMax: Y1 axis (Ic) maximum value
Y2AxishFEMin: Y2 axis (hFE) minimum value
Y2AxishFEMax: Y2 axis (hFE) maximum value
[Test Parameters]
Memo: Memorandum
Base: SMU connected to Base terminal, primary sweep voltage output
IbStart: Sweep start current for base pulse bias
IbStop: Sweep stop current for base pulse bias
IbStep: Sweep step current for gate pulse bias
VbeLimit: Upper limit of gate voltage
IbBase: Base pulse baseline current
Ibwidth: Base pulse width
IbDElay: Base pulse delay time
Collector: SMU connected to drain terminal, constant voltage output
Vce: Collector voltage
IcLimit: Upper limit of drain current
VceBase: Collector pulse base line voltage
VceWidth: Collector pulse width
VceDelay: Collector pulse delay time
Emitter: GNDU connected to emitter terminal
PulsePeriodMode: Pluse period mode, AUTO or MANUAL
ManualPulsePeriod: Pulse period, effective if PulsePeriodMode=MANUAL
MeasurementTime: Actural measurement time for a pulse period
PulseAvgCnt: Pulse averaging count
[Extended Test Parameters]
VceLimit: Upper limit of collector voltage during a search
VSrchOffset: Offset voltage to start searching
VSrchRange: Minimum search range of collector voltage
VSrchPoint: Search step count
VSrchLimit: Limit of output voltage during a search
Debug: Turn on/off debug mode
LoopMax: Maximu loop count for repetitive search
Agilent EasyEXPERT Application Library Reference, Edition 8
25-14
Summary of Contents for EasyEXPERT
Page 1: ...Agilent Technologies Agilent EasyEXPERT Application Library Reference ...
Page 17: ...1 BJT ...
Page 63: ...2 CMOS ...
Page 119: ...3 Discrete ...
Page 127: ...4 GenericTest ...
Page 133: ...5 MCSMU_IV ...
Page 141: ...6 Memory ...
Page 211: ...7 MixedSignal ...
Page 249: ...8 NanoTech ...
Page 265: ...9 Organic ...
Page 269: ...10 PwrDevice ...
Page 285: ...11 Reliability ...
Page 377: ...12 Sample ...
Page 381: ...13 Solar Cell ...
Page 401: ...14 SPGU_PLSDIV ...
Page 409: ...15 Structure ...
Page 459: ...16 TFT ...
Page 463: ...17 Utility ...
Page 478: ...17 Utility Agilent EasyEXPERT Application Library Reference Edition 8 17 16 ...
Page 479: ...18 WGFMU ...
Page 493: ...19 WGFMU_IV ...
Page 505: ...20 GaN Diode ...
Page 511: ...21 GaN FET ...
Page 523: ...22 IGBT ...
Page 549: ...23 Interconnection ...
Page 553: ...24 MISCAP ...
Page 561: ...25 PowerBJT ...
Page 576: ...25 PowerBJT Agilent EasyEXPERT Application Library Reference Edition 8 25 16 ...
Page 577: ...26 PowerDiode ...
Page 585: ...27 PowerMOSFET PMIC SiC ...