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11 Reliability
MeasBase: SMU connected to Base terminal, voltage output
MeasEmitter: SMU connected to Emitter terminal, primary sweep constant voltage output
VbStart: Sweep start voltage for Base terminal
VbStop: Sweep stop voltage for Base terminal
VbStep: Sweep step voltage for Base terminal
Ic@hfe: Collector current determining the hfe
Vc: Collector voltage
[Extended Test Parameters]
[Extended Test Parameters for Sampling_Stress]
VbStrs: Stress voltage for Base terminal
VcStrs: Stress voltage for Collector terminal
IeStrsLimit: Emitter current compliance
[Extended Test Parameters for IvSweep_hfe]
Ve: Emitter voltage
hfe_Min: Minimum hfe value for graph scale
hfe_Max: Maximum hfe value for graph scale
HoldTime: Hold time
DelayTime: Delay time
BaseMinRng1: Minimum range for base current measurement on device 1
BaseMinRng2: Minimum range for base current measurement on device 2
BaseMinRng3: Minimum range for base current measurement on device 3
CollectorMinRng1: Minimum range for collector current measurement on device 1
CollectorMinRng2: Minimum range for collector current measurement on device 2
CollectorMinRng3: Minimum range for collector current measurement on device 3
[User Function]
[User Function for Sampling_Stress]
Maximum elapsed time value MaxTime=max(Time)
Stress time StressTime=Time
[User Function for IvSweep_hfe]
Current amplification factor hfe=Icollector/Ibase
[Analysis Function]
[Analysis Function for IvSweep_hfe]
Ib@Ic=@L1X (X intercept of Line1)
hfe@Ic=@L2Y3 (X intercept of Line2)
[Auto Analysis]
[Auto Analysis for IvSweep_hfe]
Line1: Horizontal line for Y1 at Icollector=Ic@hfe
Line2: Horizontal line for Y3 at Icollector=Ic@hfe
[Test Output: X-Y Graph]
X axis: Accumulated stress time TimeList (LOG)
Y1 axis: Collector current for device 1 Dev1_IcList (LINEAR)
Y2 axis: Collector current for device 2 Dev2_IcList (LINEAR)
Y3 axis: Collector current for device 3 Dev3_IcList (LINEAR)
Y4 axis: Y3 accumulation data at Icollector=Ic@hfe for device 1 Dev1_hfe@IcList (LINEAR)
Y5 axis: Y3 accumulation data at Icollector=Ic@hfe for device 2 Dev2_hfe@IcList (LINEAR)
Y6 axis: Y3 accumulation data at Icollector=Ic@hfe for device 3 Dev3_hfe@IcList (LINEAR)
Agilent EasyEXPERT Application Library Reference, Edition 8
11-7
Summary of Contents for EasyEXPERT
Page 1: ...Agilent Technologies Agilent EasyEXPERT Application Library Reference ...
Page 17: ...1 BJT ...
Page 63: ...2 CMOS ...
Page 119: ...3 Discrete ...
Page 127: ...4 GenericTest ...
Page 133: ...5 MCSMU_IV ...
Page 141: ...6 Memory ...
Page 211: ...7 MixedSignal ...
Page 249: ...8 NanoTech ...
Page 265: ...9 Organic ...
Page 269: ...10 PwrDevice ...
Page 285: ...11 Reliability ...
Page 377: ...12 Sample ...
Page 381: ...13 Solar Cell ...
Page 401: ...14 SPGU_PLSDIV ...
Page 409: ...15 Structure ...
Page 459: ...16 TFT ...
Page 463: ...17 Utility ...
Page 478: ...17 Utility Agilent EasyEXPERT Application Library Reference Edition 8 17 16 ...
Page 479: ...18 WGFMU ...
Page 493: ...19 WGFMU_IV ...
Page 505: ...20 GaN Diode ...
Page 511: ...21 GaN FET ...
Page 523: ...22 IGBT ...
Page 549: ...23 Interconnection ...
Page 553: ...24 MISCAP ...
Page 561: ...25 PowerBJT ...
Page 576: ...25 PowerBJT Agilent EasyEXPERT Application Library Reference Edition 8 25 16 ...
Page 577: ...26 PowerDiode ...
Page 585: ...27 PowerMOSFET PMIC SiC ...