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11 Reliability
Dev3_IdsList: Drain current for device 3
Dev1_VthIdList: Vth for device 1, determined by constant current method
Dev2_VthIdList: Vth for device 2, determined by constant current method
Dev3_VthIdList: Vth for device 3, determined by constant current method
Dev1_VthGmList: Vth for device 1, determined by extrapolation method
Dev2_VthGmList: Vth for device 2, determined by extrapolation method
Dev3_VthGmList: Vth for device 3, determined by extrapolation method
Dev1_gmMaxList: Maximum transconductance value for device 1
Dev2_gmMaxList: Maximum transconductance value for device 2
Dev3_gmMaxList: Maximum transconductance value for device 3
Agilent EasyEXPERT Application Library Reference, Edition 8
11-65
Summary of Contents for EasyEXPERT
Page 1: ...Agilent Technologies Agilent EasyEXPERT Application Library Reference ...
Page 17: ...1 BJT ...
Page 63: ...2 CMOS ...
Page 119: ...3 Discrete ...
Page 127: ...4 GenericTest ...
Page 133: ...5 MCSMU_IV ...
Page 141: ...6 Memory ...
Page 211: ...7 MixedSignal ...
Page 249: ...8 NanoTech ...
Page 265: ...9 Organic ...
Page 269: ...10 PwrDevice ...
Page 285: ...11 Reliability ...
Page 377: ...12 Sample ...
Page 381: ...13 Solar Cell ...
Page 401: ...14 SPGU_PLSDIV ...
Page 409: ...15 Structure ...
Page 459: ...16 TFT ...
Page 463: ...17 Utility ...
Page 478: ...17 Utility Agilent EasyEXPERT Application Library Reference Edition 8 17 16 ...
Page 479: ...18 WGFMU ...
Page 493: ...19 WGFMU_IV ...
Page 505: ...20 GaN Diode ...
Page 511: ...21 GaN FET ...
Page 523: ...22 IGBT ...
Page 549: ...23 Interconnection ...
Page 553: ...24 MISCAP ...
Page 561: ...25 PowerBJT ...
Page 576: ...25 PowerBJT Agilent EasyEXPERT Application Library Reference Edition 8 25 16 ...
Page 577: ...26 PowerDiode ...
Page 585: ...27 PowerMOSFET PMIC SiC ...