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22 IGBT
22.5
Ic(off)-Vce: IGBT Ic(off)-Vce characteristics (A.04.00)
[Supported Analyzer]
B1505A
[Description]
Measures and plots Collector current vs Collector-Emitter voltage in cutoff region and extracts Collector-
Emitter cutoff current and breakdown voltage.
[Device Under Test]
IGBT, 3 terminals
[Device Parameters]
Polarity: Nch (SMU forces the specified value) or Pch (SMU forces the negative specified value).
Temp: Temperature
[Test Parameters]
Memo: Memorandum
IntegTime: Integration time
Collector: SMU connected to Collector terminal, primary sweep voltage output
Vc@Ices: Collector voltage to decide Collector-Emitter cutoff current Ices
Ic@BVces: Collector current to decide Collector-Emitter breakdown voltage BVces
VcStart: Sweep start voltage for Collector terminal
VcStop: Sweep stop voltage for Collector terminal
VcStep: Sweep step voltage for Collector terminal
Gate: SMU connected to Gate terminal, constant voltage output
Vg: Gate voltage
Emitter: GNDU connected to Emitter terminal
IcLimit: Collector current compliance
[Extended Test Parameters]
IgLimit: Gate current compliance
HoldTime: Hold time
DelayTime: Delay time
IcZero: Y axis (Icollector) minimum value
IcMinRange: Minimum range for the collector current measurement
IgMinRange: Minimum range for the gate current measurement
[Measurement Parameters]
Collector current Icollector
Gate current Igate
[User Function]
Ta: Temperature Ta=Temp
[Analysis Function]
BVces=@MX (X coordinate of Marker)
Ices=@L1Y (Y intercept of Line1)
[Auto Analysis]
Marker: Icollector=Ic@BVces
Line1: Vcollector=Vc@Ices
[X-Y Plot]
Agilent EasyEXPERT Application Library Reference, Edition 8
22-11
Summary of Contents for EasyEXPERT
Page 1: ...Agilent Technologies Agilent EasyEXPERT Application Library Reference ...
Page 17: ...1 BJT ...
Page 63: ...2 CMOS ...
Page 119: ...3 Discrete ...
Page 127: ...4 GenericTest ...
Page 133: ...5 MCSMU_IV ...
Page 141: ...6 Memory ...
Page 211: ...7 MixedSignal ...
Page 249: ...8 NanoTech ...
Page 265: ...9 Organic ...
Page 269: ...10 PwrDevice ...
Page 285: ...11 Reliability ...
Page 377: ...12 Sample ...
Page 381: ...13 Solar Cell ...
Page 401: ...14 SPGU_PLSDIV ...
Page 409: ...15 Structure ...
Page 459: ...16 TFT ...
Page 463: ...17 Utility ...
Page 478: ...17 Utility Agilent EasyEXPERT Application Library Reference Edition 8 17 16 ...
Page 479: ...18 WGFMU ...
Page 493: ...19 WGFMU_IV ...
Page 505: ...20 GaN Diode ...
Page 511: ...21 GaN FET ...
Page 523: ...22 IGBT ...
Page 549: ...23 Interconnection ...
Page 553: ...24 MISCAP ...
Page 561: ...25 PowerBJT ...
Page 576: ...25 PowerBJT Agilent EasyEXPERT Application Library Reference Edition 8 25 16 ...
Page 577: ...26 PowerDiode ...
Page 585: ...27 PowerMOSFET PMIC SiC ...