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18 WGFMU
18.7
WGFMU Pattern Editor (A.03.20)
[Supported Analyzer]
B1500A
[Description]
Performs the WGFMU channel output setup and the measurement setup.
Set the ExecutionMode to Run Vector and click the Single button to perform the WGFMU channel output and
measurement.
[Test Parameters]
ExecutionMode: Execution mode
Run Vector: Performs the waveform output and measurement
Pattern Validation: Displays the waveform and measurement setup, for debugging
[WGFMU1 and WGFMU2]
Enable: Enable (uses the channel) or Disable (does not use)
Channel: WGFMU channel to use
OperationMode: Operation mode
PG Vmeas (PG mode, voltage measurement)
Fast IV Imeas (Fast IV mode, current measurement)
Fast IV Vmeas (Fast IV mode, voltage measurement)
VForceRange: Voltage output range
Auto, 3V, 5V, -10V to 0V, or 0V to 10V
InitMeasRange: Measurement range
For current measurement: 1uA, 10uA, 100uA, 1mA, or 10mA
For voltage measurement: 5V or 10V
[Pattern]
RepeatCount: Repeat count of waveform data and measurement event data
WaveformCh1: Channel1 waveform data
WaveformCh2: Channel2 waveform data
MeasurementEvent: Measurement event data
Waveform data and measurement event data can be defined by using the Define vector data dialog box. To open the
Define vector data dialog box, click the left button of each field. Clicking the * button on the dialog box increases the
row.
Waveform data:
Column 1: Time (absolute value)
Column 2: Voltage output value
Measurement event data:
Column 1: Sampling measurement start time (absolute value)
Column 2: Number of measurement points per one sampling
Column 3: Sampling interval
Column 4: Averaging time per one point measurement
Column 5: Ch1 range event
Column 6: Ch2 range event
For the column 5 and 6, 0 is set normally. For the current measurement, setting a number from 1 to 5 enables the
range event. This changes the current measurement range to the specified range when the sampling measurement is
started.
1: 1uA, 2: 10uA, 3: 100uA, 4: 1mA, 5: 10mA
To set the range event only without the measurement event, enter 0 to the column 2 and set the column 5 and 6.
Agilent EasyEXPERT Application Library Reference, Edition 8
18-13
Summary of Contents for EasyEXPERT
Page 1: ...Agilent Technologies Agilent EasyEXPERT Application Library Reference ...
Page 17: ...1 BJT ...
Page 63: ...2 CMOS ...
Page 119: ...3 Discrete ...
Page 127: ...4 GenericTest ...
Page 133: ...5 MCSMU_IV ...
Page 141: ...6 Memory ...
Page 211: ...7 MixedSignal ...
Page 249: ...8 NanoTech ...
Page 265: ...9 Organic ...
Page 269: ...10 PwrDevice ...
Page 285: ...11 Reliability ...
Page 377: ...12 Sample ...
Page 381: ...13 Solar Cell ...
Page 401: ...14 SPGU_PLSDIV ...
Page 409: ...15 Structure ...
Page 459: ...16 TFT ...
Page 463: ...17 Utility ...
Page 478: ...17 Utility Agilent EasyEXPERT Application Library Reference Edition 8 17 16 ...
Page 479: ...18 WGFMU ...
Page 493: ...19 WGFMU_IV ...
Page 505: ...20 GaN Diode ...
Page 511: ...21 GaN FET ...
Page 523: ...22 IGBT ...
Page 549: ...23 Interconnection ...
Page 553: ...24 MISCAP ...
Page 561: ...25 PowerBJT ...
Page 576: ...25 PowerBJT Agilent EasyEXPERT Application Library Reference Edition 8 25 16 ...
Page 577: ...26 PowerDiode ...
Page 585: ...27 PowerMOSFET PMIC SiC ...