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1 BJT
1.34
Re+Rc: Collector resistance (including Emitter resistance, flyback method,
4-terminal) (A.01.20)
[Supported Analyzer]
B1500A, 4155B, 4155C, 4156B, 4156C
[Description]
Measures the collector voltage vs collector current characteristics, and extracts the combined resistance of the
collector resistance and the emitter resistance. Uses the flyback method.
[Device Under Test]
Bipolar transistor, 4 terminals
[Device Parameters]
Polarity: NPN (SMUs force the specified value) or PNP (SMUs force the negative specified value).
Le: Emitter length
We: Emitter width
Temp: Temperature
[Test Parameters]
IntegTime: Integration time
Collector: SMU connected to Collector terminal, primary sweep current output
IcStart: Sweep start current for Collector terminal
IcStop: Sweep stop current for Collector terminal
IcStep: Sweep step current for Collector terminal
VcLimit: Collector voltage compliance
Base: SMU connected to Base terminal, constant current output
Ib: Base current
Emitter: SMU connected to Emitter terminal, constant voltage output
Subs: SMU connected to Substrate, constant voltage output
Vsubs: Substrate voltage
IsubsLimit: Substrate current compliance
[Extended Test Parameters]
Ve: Emitter voltage
VbLimit: Base voltage compliance
HoldTime: Hold time
DelayTime: Delay time
EmitterMinRng: Minimum range for the emitter current measurement
SubsMinRng: Minimum range for the substrate current measurement
[Measurement Parameters]
Collector voltage Vcollector
[User Function]
IePerArea=Iemitter/Le/We
IbPerArea=Ibase/Le/We
IsPerArea=Isubs/Le/We
Rc_Re=diff(Vcollector,Icollector)
[X-Y Plot]
X axis: Collector current Icollector (LINEAR)
Y1 axis: Collector voltage Vcollector (LINEAR)
Y2 axis: Combined resistance of Collector resistance and Emitter resistance
Agilent EasyEXPERT Application Library Reference, Edition 8
1-40
Summary of Contents for EasyEXPERT
Page 1: ...Agilent Technologies Agilent EasyEXPERT Application Library Reference ...
Page 17: ...1 BJT ...
Page 63: ...2 CMOS ...
Page 119: ...3 Discrete ...
Page 127: ...4 GenericTest ...
Page 133: ...5 MCSMU_IV ...
Page 141: ...6 Memory ...
Page 211: ...7 MixedSignal ...
Page 249: ...8 NanoTech ...
Page 265: ...9 Organic ...
Page 269: ...10 PwrDevice ...
Page 285: ...11 Reliability ...
Page 377: ...12 Sample ...
Page 381: ...13 Solar Cell ...
Page 401: ...14 SPGU_PLSDIV ...
Page 409: ...15 Structure ...
Page 459: ...16 TFT ...
Page 463: ...17 Utility ...
Page 478: ...17 Utility Agilent EasyEXPERT Application Library Reference Edition 8 17 16 ...
Page 479: ...18 WGFMU ...
Page 493: ...19 WGFMU_IV ...
Page 505: ...20 GaN Diode ...
Page 511: ...21 GaN FET ...
Page 523: ...22 IGBT ...
Page 549: ...23 Interconnection ...
Page 553: ...24 MISCAP ...
Page 561: ...25 PowerBJT ...
Page 576: ...25 PowerBJT Agilent EasyEXPERT Application Library Reference Edition 8 25 16 ...
Page 577: ...26 PowerDiode ...
Page 585: ...27 PowerMOSFET PMIC SiC ...