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Revision number
The test definitions are managed by using the revision number shown below.
NOTE
Application Library
The application library is a set of test definitions effective for the EasyEXPERT application
test execution mode. The application test can be performed by selecting a test definition
and setting the test condition for the actual DUT (device under test). And the setup can be
saved as the dedicated test setup for the DUT.
All test definitions are just sample. If the samples damage your devices, Agilent
Technologies is NOT LIABLE for the damage.
NOTE
If you delete a test definition
Application library should be recovered. Import the test definition by using the Import Test
Definition... function of the Library button. The original test definitions are stored in the
following folders.
<program folder>\Agilent\B1500\EasyEXPERT\Application Tests
<program folder>\Agilent\B1500\EasyEXPERT\Contribution\Application Tests
Revision Number
Description
A.01.xx
Test definitions supported by EasyEXPERT A.01.xx and later.
A.01.20
Test definitions updated from A.01.xx or supported by
EasyEXPERT A.02.00 and later.
A.02.00
This number is used by the Subsite move test definition only.
A.03.00
Test definitions supported by EasyEXPERT A.03.00 and later.
A.03.10
Test definitions supported by EasyEXPERT A.03.10 and later.
A.03.11
Test definitions supported by EasyEXPERT A.03.11 and later.
A.03.20
Test definitions supported by EasyEXPERT A.03.20 and later.
A.04.00
Test definitions supported by EasyEXPERT A.04.00 and later.
A.05.00
Test definitions supported by EasyEXPERT A.05.00 and later.
A.05.01
Test definitions supported by EasyEXPERT A.05.01 and later.
A.05.02
Test definitions supported by EasyEXPERT A.05.02 and later.
A.05.03
Test definitions supported by EasyEXPERT A.05.03 and later.
A.05.50
Test definitions supported by EasyEXPERT A.05.50 and later.
Summary of Contents for EasyEXPERT
Page 1: ...Agilent Technologies Agilent EasyEXPERT Application Library Reference ...
Page 17: ...1 BJT ...
Page 63: ...2 CMOS ...
Page 119: ...3 Discrete ...
Page 127: ...4 GenericTest ...
Page 133: ...5 MCSMU_IV ...
Page 141: ...6 Memory ...
Page 211: ...7 MixedSignal ...
Page 249: ...8 NanoTech ...
Page 265: ...9 Organic ...
Page 269: ...10 PwrDevice ...
Page 285: ...11 Reliability ...
Page 377: ...12 Sample ...
Page 381: ...13 Solar Cell ...
Page 401: ...14 SPGU_PLSDIV ...
Page 409: ...15 Structure ...
Page 459: ...16 TFT ...
Page 463: ...17 Utility ...
Page 478: ...17 Utility Agilent EasyEXPERT Application Library Reference Edition 8 17 16 ...
Page 479: ...18 WGFMU ...
Page 493: ...19 WGFMU_IV ...
Page 505: ...20 GaN Diode ...
Page 511: ...21 GaN FET ...
Page 523: ...22 IGBT ...
Page 549: ...23 Interconnection ...
Page 553: ...24 MISCAP ...
Page 561: ...25 PowerBJT ...
Page 576: ...25 PowerBJT Agilent EasyEXPERT Application Library Reference Edition 8 25 16 ...
Page 577: ...26 PowerDiode ...
Page 585: ...27 PowerMOSFET PMIC SiC ...