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17 Utility
17.10
Subsite move: Probing next subsite (A.02.00)
[Supported Analyzer]
B1500A, B1505A, 4155B, 4155C, 4156B, 4156C
[Description]
Moves wafer prober chuck to the next subsite, reads
device ID from the prober, and sets it to the Device ID of
the test record.
[Supported Probers]
While this application test supports Cascade Microtech,
SUSS MicroTec and Vector Semiconductor wafer prober drivers
as standard basis, you may specify a command path name into
the CustomProber entry field to operate with a non-standard
wafer prober driver.
[Test Parameters]
ProberType: Type of wafer prober
CustomProber: Command path name for non-standard wafer probers
If CustomProber is not blank, ProberType field is ignored.
Agilent EasyEXPERT Application Library Reference, Edition 8
17-12
Summary of Contents for EasyEXPERT
Page 1: ...Agilent Technologies Agilent EasyEXPERT Application Library Reference ...
Page 17: ...1 BJT ...
Page 63: ...2 CMOS ...
Page 119: ...3 Discrete ...
Page 127: ...4 GenericTest ...
Page 133: ...5 MCSMU_IV ...
Page 141: ...6 Memory ...
Page 211: ...7 MixedSignal ...
Page 249: ...8 NanoTech ...
Page 265: ...9 Organic ...
Page 269: ...10 PwrDevice ...
Page 285: ...11 Reliability ...
Page 377: ...12 Sample ...
Page 381: ...13 Solar Cell ...
Page 401: ...14 SPGU_PLSDIV ...
Page 409: ...15 Structure ...
Page 459: ...16 TFT ...
Page 463: ...17 Utility ...
Page 478: ...17 Utility Agilent EasyEXPERT Application Library Reference Edition 8 17 16 ...
Page 479: ...18 WGFMU ...
Page 493: ...19 WGFMU_IV ...
Page 505: ...20 GaN Diode ...
Page 511: ...21 GaN FET ...
Page 523: ...22 IGBT ...
Page 549: ...23 Interconnection ...
Page 553: ...24 MISCAP ...
Page 561: ...25 PowerBJT ...
Page 576: ...25 PowerBJT Agilent EasyEXPERT Application Library Reference Edition 8 25 16 ...
Page 577: ...26 PowerDiode ...
Page 585: ...27 PowerMOSFET PMIC SiC ...