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2 CMOS
2.33
Vth-Wg: Vth-Wg characteristics (A.01.20)
[Supported Analyzer]
B1500A
[Description]
Measures the Id-Vg characteristics of MOSFET with different Wg (gate width) and plots the Vth's dependency
on Wg (threshold voltage).
[Device Under Test]
MOSFET, 4 terminals
[Required Modules and Accessories]
Agilent B2200A or B2201A switching matrix 1 unit
GPIB cable
Connect B2200A/B2201A to B1500A with a measuring cable and GPIB cable.
Set information on B1500A SMU channel's connection to the B2200A/B2201A input port properly on the
Switching Matrix tab screen of the Configuration window.
Set the output channel number of B2200A/B2201A connected to each terminal of a device under test properly
in the G#/D#/E#/S#/Sb# field (# is an integer from 1 to 12) of Test Parameters area.
The maximum number of devices connected at once depends on the number of matrix modules mounted on
B2200A/B2201A. Maximum three devices can be connected to one module at once.
[Setting of Wg#/G#/D#/S#/Sb# field (# is an integer from 1 to 12)]
Set one device for Wg#(gate width)/G#(gate)/D#(drain)/S#(source)/Sb#(substrate). Wg1<Wg2<Wg3…
must be satisfied. Enter zero for a field with no device.
[Device Parameters]
Polarity: Nch (SMUs force the specified value) or Pch (SMUs force the negative specified value)
Temp: Temperature (deg C)
IdMax: Drain current compliance
[Test Parameters]
IntegTime: Integration time
GateSMU: SMU connected to Gate terminal, primary sweep voltage output
DrainSMU: SMU connected to Drain terminal, constant voltage output
SbSMU: SMU connected to Substrate, constant voltage output
SourceSMU: SMU connected to Source terminal, constant voltage output
VgStart: Sweep start voltage for Gate terminal
VgStop: Sweep stop voltage for Gate terminal
VgStep: Sweep step voltage for Gate terminal
Vd: Drain voltage, ideally at around 100mV
Vsubs: Substrate voltage
Lg: Gate length
Wg1 - Wg12: Gate width for MOSFETs
G1 - G12: SWM Pin Assign setting for Gate of devices
D1 - D12: SWM Pin Assign setting for Drain of devices
S1 - S12: SWM Pin Assign setting for Source of devices
Sb1 - Sb12: SWM Pin Assign setting for Subs of devices
[Extended Test Parameters]
Vs: Source voltage
IgLimit: Gate current compliance
Agilent EasyEXPERT Application Library Reference, Edition 8
2-55
Summary of Contents for EasyEXPERT
Page 1: ...Agilent Technologies Agilent EasyEXPERT Application Library Reference ...
Page 17: ...1 BJT ...
Page 63: ...2 CMOS ...
Page 119: ...3 Discrete ...
Page 127: ...4 GenericTest ...
Page 133: ...5 MCSMU_IV ...
Page 141: ...6 Memory ...
Page 211: ...7 MixedSignal ...
Page 249: ...8 NanoTech ...
Page 265: ...9 Organic ...
Page 269: ...10 PwrDevice ...
Page 285: ...11 Reliability ...
Page 377: ...12 Sample ...
Page 381: ...13 Solar Cell ...
Page 401: ...14 SPGU_PLSDIV ...
Page 409: ...15 Structure ...
Page 459: ...16 TFT ...
Page 463: ...17 Utility ...
Page 478: ...17 Utility Agilent EasyEXPERT Application Library Reference Edition 8 17 16 ...
Page 479: ...18 WGFMU ...
Page 493: ...19 WGFMU_IV ...
Page 505: ...20 GaN Diode ...
Page 511: ...21 GaN FET ...
Page 523: ...22 IGBT ...
Page 549: ...23 Interconnection ...
Page 553: ...24 MISCAP ...
Page 561: ...25 PowerBJT ...
Page 576: ...25 PowerBJT Agilent EasyEXPERT Application Library Reference Edition 8 25 16 ...
Page 577: ...26 PowerDiode ...
Page 585: ...27 PowerMOSFET PMIC SiC ...