
19 WGFMU_IV
19.3
WGFMU Id-Vd pulse (A.05.03.2013.0124_2013.03.26.1)
[Supported Analyzer]
B1500A
[Description]
Measures the drain current vs drain voltage characteristics of MOSFET using WGFMU pulse
[Device Under Test]
MOSFET
[Device Parameters]
Lg: Gate Length
Wg: Gate Width
Temp: Temperature
[Test Parameters]
Period: Pulse period
Drain: WGFMU connected to Drain, primary sweep voltage output
VdStart: Sweep start voltage of pulse top for Drain
VdStop: Sweep stop voltage of pulse top for Drain
VdStep: Sweep step voltage of pulse top for Drain
VdPulseBase: Pulse base voltage for Drain
VdPulseDelay: Pulse delay for Drain
VdPulseRiseTime: Pulse rise time for Drain
VdPulseWidth: Pulse width for Drain
VdPulseFallTime: Pulse fall time for Drain
Gate: WGFMU connected to Gate, secondary sweep voltage output
VgStart: Sweep start voltage of pulse top for Gate
VgStop: Sweep stop voltage of pulse top for Gate
VgStep: Sweep step voltage of pulse top for Gate
VgPulseBase: Pulse base voltage for Gate
VgPulseDelay: Pulse delay for Gate
VgPulseRiseTime: Pulse rise time for Gate
VgPulseWidth: Pulse width for Gate
VgPulseFallTime: Pulse fall time for Gate
MeasRange: Measurement range for drain current
Hold: Hold Time
MeasDelay: Measurement delay time
AveragingTime: Measurement averaging time
[Extended Test Parameters]
DataDisplay_PatternValidation : PatternValidation data display mode (Not effective for Pattern Validation
mode)
Disable (does not display PatternValidation data during measurement)
Enable_Waveform_MeasTiming (displays Waveform and MeasTiming during measurement)
ExecutionMode: Execution mode
Run Vector: Performs the waveform output and measurement
Pattern Validation: Displays the waveform and measurement
Agilent EasyEXPERT Application Library Reference, Edition 8
19-6
Summary of Contents for EasyEXPERT
Page 1: ...Agilent Technologies Agilent EasyEXPERT Application Library Reference ...
Page 17: ...1 BJT ...
Page 63: ...2 CMOS ...
Page 119: ...3 Discrete ...
Page 127: ...4 GenericTest ...
Page 133: ...5 MCSMU_IV ...
Page 141: ...6 Memory ...
Page 211: ...7 MixedSignal ...
Page 249: ...8 NanoTech ...
Page 265: ...9 Organic ...
Page 269: ...10 PwrDevice ...
Page 285: ...11 Reliability ...
Page 377: ...12 Sample ...
Page 381: ...13 Solar Cell ...
Page 401: ...14 SPGU_PLSDIV ...
Page 409: ...15 Structure ...
Page 459: ...16 TFT ...
Page 463: ...17 Utility ...
Page 478: ...17 Utility Agilent EasyEXPERT Application Library Reference Edition 8 17 16 ...
Page 479: ...18 WGFMU ...
Page 493: ...19 WGFMU_IV ...
Page 505: ...20 GaN Diode ...
Page 511: ...21 GaN FET ...
Page 523: ...22 IGBT ...
Page 549: ...23 Interconnection ...
Page 553: ...24 MISCAP ...
Page 561: ...25 PowerBJT ...
Page 576: ...25 PowerBJT Agilent EasyEXPERT Application Library Reference Edition 8 25 16 ...
Page 577: ...26 PowerDiode ...
Page 585: ...27 PowerMOSFET PMIC SiC ...