
10 PwrDevice
10.1
BVdss[3] PwrDevice: Breakdown voltage between source and drain
(A.01.20)
[Supported Analyzer]
B1500A
[Description]
Measures the breakdown voltage between source and drain of a power MOSFET. Forces drain sweep voltage
in the direction of FET on, and monitors breakdown.
[Device Under Test]
Power MOSFET, 3 terminals
[Device Parameters]
Polarity: Nch (SMUs force the specified value) or Pch (SMUs force the negative specified value).
Lg: Gate length
Wg: Gate width
Temp: Temperature
[Test Parameters]
IntegTime: Integration time
Is@BVdss: Source current deemed to be a breakdown
Drain: SMU connected to Drain, primary sweep voltage output
VdStart: Sweep start voltage for Drain
VdStop: Sweep stop voltage for Drain
VdStep: Sweep step voltage for Drain
Gate: SMU connected to Gate, constant voltage output
Vg: Gate voltage
Source: SMU connected to Source, constant voltage output
BaseOffsetV: Base offset voltage
Base offset voltage is added to the specified voltage. For example, the gate start voltage will be
BaseOffsetV.
[Extended Test Parameters]
Vs: Source voltage
HoldTime: Hold time
DelayTime: Delay time
DrainMinRng: Minimum range for drain current measurement
GateMinRng: Minimum range for gate current measurement
IgLimit: Gate current compliance
[Measurement Parameters]
Drain current Idrain
Source current Isource
For the Source terminal, the SMU current compliance is set to Is@BVdss*1.1.
[User Function]
IsourcePerWg=Isource/Wg: Source current per unit gate width
IdrainPerWg=Idrain/Wg: Drain current per unit gate width
[Analysis Function]
Agilent EasyEXPERT Application Library Reference, Edition 8
10-3
Summary of Contents for EasyEXPERT
Page 1: ...Agilent Technologies Agilent EasyEXPERT Application Library Reference ...
Page 17: ...1 BJT ...
Page 63: ...2 CMOS ...
Page 119: ...3 Discrete ...
Page 127: ...4 GenericTest ...
Page 133: ...5 MCSMU_IV ...
Page 141: ...6 Memory ...
Page 211: ...7 MixedSignal ...
Page 249: ...8 NanoTech ...
Page 265: ...9 Organic ...
Page 269: ...10 PwrDevice ...
Page 285: ...11 Reliability ...
Page 377: ...12 Sample ...
Page 381: ...13 Solar Cell ...
Page 401: ...14 SPGU_PLSDIV ...
Page 409: ...15 Structure ...
Page 459: ...16 TFT ...
Page 463: ...17 Utility ...
Page 478: ...17 Utility Agilent EasyEXPERT Application Library Reference Edition 8 17 16 ...
Page 479: ...18 WGFMU ...
Page 493: ...19 WGFMU_IV ...
Page 505: ...20 GaN Diode ...
Page 511: ...21 GaN FET ...
Page 523: ...22 IGBT ...
Page 549: ...23 Interconnection ...
Page 553: ...24 MISCAP ...
Page 561: ...25 PowerBJT ...
Page 576: ...25 PowerBJT Agilent EasyEXPERT Application Library Reference Edition 8 25 16 ...
Page 577: ...26 PowerDiode ...
Page 585: ...27 PowerMOSFET PMIC SiC ...