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In This Document
Agilent EasyEXPERT software contains the application library which supports the
characteristic measurements of CMOS devices, TFT, BJT, diode, resistor, capacitor,
varactor, memory, nanotechnology devices such as CNT FET, and so on. The application
library includes more than one hundred test definitions. And they are classified into the
following categories.
•
BJT
•
CMOS
•
Discrete
•
GenericTest
•
MCSMU_IV
•
Memory
•
MixedSignal
•
NanoTech
•
Organic
•
PwrDevice
•
Reliability
•
Sample
•
Solar Cell
•
SPGU_PLSDIV
•
Structure
•
TFT
•
Utility
•
WGFMU
•
WGFMU Utility
•
WGFMU_IV
•
GaN Diode
•
GaN FET
•
IGBT
•
Interconnection
•
MISCAP
•
PowerBJT
•
PowerDiode
•
PowerMOSFET
•
PMIC
•
SiC
Summary of Contents for EasyEXPERT
Page 1: ...Agilent Technologies Agilent EasyEXPERT Application Library Reference ...
Page 17: ...1 BJT ...
Page 63: ...2 CMOS ...
Page 119: ...3 Discrete ...
Page 127: ...4 GenericTest ...
Page 133: ...5 MCSMU_IV ...
Page 141: ...6 Memory ...
Page 211: ...7 MixedSignal ...
Page 249: ...8 NanoTech ...
Page 265: ...9 Organic ...
Page 269: ...10 PwrDevice ...
Page 285: ...11 Reliability ...
Page 377: ...12 Sample ...
Page 381: ...13 Solar Cell ...
Page 401: ...14 SPGU_PLSDIV ...
Page 409: ...15 Structure ...
Page 459: ...16 TFT ...
Page 463: ...17 Utility ...
Page 478: ...17 Utility Agilent EasyEXPERT Application Library Reference Edition 8 17 16 ...
Page 479: ...18 WGFMU ...
Page 493: ...19 WGFMU_IV ...
Page 505: ...20 GaN Diode ...
Page 511: ...21 GaN FET ...
Page 523: ...22 IGBT ...
Page 549: ...23 Interconnection ...
Page 553: ...24 MISCAP ...
Page 561: ...25 PowerBJT ...
Page 576: ...25 PowerBJT Agilent EasyEXPERT Application Library Reference Edition 8 25 16 ...
Page 577: ...26 PowerDiode ...
Page 585: ...27 PowerMOSFET PMIC SiC ...