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13 Sollar Cell
13.4
Solar Cell DLCP: Solar Cell drive-level capacitance profiling
(A.05.03.2013.0124_2013.02.27.1)
[Supported Analyzer]
B1500A
[Description]
Measures the anode-cathode capacitance (Cp)-DC bias output(Vdc) characteristics of the solar cell with
sweeping the signal level (Vac), and plots the drive-level density (Ndl) - the depletion width (W) characteristics.
Vdc is changed from VdcStart to VdcStop in VdcStep steps. Vac is swept for the peak-to-peak voltage Vpp to
change from VppStart to VppStop in VppStep steps. The maximum and minimum value of the applied voltage
should be kept Vdc, Vdc-Vpp respectively. The CMU performs Vdc sweep measurement of the parallel
capacitance (Cp) and conductance (G) at each signal level.
[Reference]
IV and CV Characterizations of Solar/Photovoltaic Cells Using the B1500A
http://cp.literature.agilent.com/litweb/pdf/5990-4428EN.pdf
[Device Under Test]
Solar Cell
[Required Modules and Accessories]
1 unit of Agilent B1520A MFCMU
[Device Parameters]
Temp: Temperature
Area: Area of the solar cell
Es: Relative permittivity of semiconductor
[Test Parameters]
IntegTime: Integration time
VppStart: Peak-to-peak voltage (Vpp) start value
VppStop: Vpp stop voltage
VppStep: Vpp step voltage
FREQ: Measurement frequency
Anode: CMU connected between Anode and Cathode (CV spot measurement)
VdcStart: DC bias voltage (Vdc) start voltage
VdcStop: Vdc stop voltage
Vdcstep: Vdc step voltage
[Extended Test Parameters]
HoldTime: Hold time
DelayTime: Delay time
CpMin: Minimum value of Cp axis for X-Y graph
CpMax: Maximum value of Cp axis for X-Y graph
GMin: Minimum value of G axis for X-Y graph
GMax: Maximum value of G axis for X-Y graph
NdlMin: Minimum value of Ndl axis for X-Y graph
NdlMax: Maximum value of Ndl axis for X-Y graph
WMin: Minimum value of W axis for X-Y graph
WMax: Maximum value of W axis for X-Y graph
[Measurement Parameters]
Agilent EasyEXPERT Application Library Reference, Edition 8
13-9
Summary of Contents for EasyEXPERT
Page 1: ...Agilent Technologies Agilent EasyEXPERT Application Library Reference ...
Page 17: ...1 BJT ...
Page 63: ...2 CMOS ...
Page 119: ...3 Discrete ...
Page 127: ...4 GenericTest ...
Page 133: ...5 MCSMU_IV ...
Page 141: ...6 Memory ...
Page 211: ...7 MixedSignal ...
Page 249: ...8 NanoTech ...
Page 265: ...9 Organic ...
Page 269: ...10 PwrDevice ...
Page 285: ...11 Reliability ...
Page 377: ...12 Sample ...
Page 381: ...13 Solar Cell ...
Page 401: ...14 SPGU_PLSDIV ...
Page 409: ...15 Structure ...
Page 459: ...16 TFT ...
Page 463: ...17 Utility ...
Page 478: ...17 Utility Agilent EasyEXPERT Application Library Reference Edition 8 17 16 ...
Page 479: ...18 WGFMU ...
Page 493: ...19 WGFMU_IV ...
Page 505: ...20 GaN Diode ...
Page 511: ...21 GaN FET ...
Page 523: ...22 IGBT ...
Page 549: ...23 Interconnection ...
Page 553: ...24 MISCAP ...
Page 561: ...25 PowerBJT ...
Page 576: ...25 PowerBJT Agilent EasyEXPERT Application Library Reference Edition 8 25 16 ...
Page 577: ...26 PowerDiode ...
Page 585: ...27 PowerMOSFET PMIC SiC ...