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11 Reliability
Vd3: Drain terminal voltage
IdsStopRate: Ids change rate to stop testing
[Extended Test Parameters]
StoringRuntimeData: Data save during stress output, Yes or No
[Extended Test Parameters for Sampling_Stress]
Vd: Drain terminal voltage, constant voltage
Vs: Source terminal voltage, constant voltage
Vsubs: Substrate terminal voltage, constant voltage
IgLimit: Gate current compliance
[Extended Test Parameters for IvSweep_ConstId]
HoldTime: Hold time
DelayTime: Delay time
IdLimit: Drain current compliance
IsubsLimit: Substrate current compliance
Vs: Source terminal voltage, constant voltage
Vsubs: Substrate terminal voltage, constant voltage
DrainMinRng: Minimum range for drain current measurement
[Extended Test Parameters for IvSweep_gmmax]
HoldTime: Hold time
DelayTime: Delay time
IgLimit: Gate current compliance
IdLimit: Drain current compliance
IsubsLimit: Substrate current compliance
Vs: Source terminal voltage, constant voltage
Vsubs: Substrate terminal voltage, constant voltage
Vth_Min: Minimum Vth value for graph scale
Vth_Max: Maximum Vth value for graph scale
gmMax_Min: Minimum gmMax value for graph scale
gmMax_Max: Maximum gmMax value for graph scale
DrainMinRng: Minimum range for drain current measurement
DrainMinRng: Minimum range for drain current measurement
[Extended Test Parameters for Sampling_Ids]
IgLimit: Gate current compliance
IdLimit: Drain current compliance
IsubsLimit: Substrate current compliance
Vs: Source terminal voltage, constant voltage
Vsubs: Substrate terminal voltage, constant voltage
DrainMinRng: Minimum range for drain current measurement
[Measurement Parameters]
[Measurement Parameters by Sampling_Stress]
Gate current Igate
[Measurement Parameters by IvSweep_ConstId]
Drain current Idrain
[Measurement Parameters by IvSweep_gmmax]
Drain current Idrain
Agilent EasyEXPERT Application Library Reference, Edition 8
11-29
Summary of Contents for EasyEXPERT
Page 1: ...Agilent Technologies Agilent EasyEXPERT Application Library Reference ...
Page 17: ...1 BJT ...
Page 63: ...2 CMOS ...
Page 119: ...3 Discrete ...
Page 127: ...4 GenericTest ...
Page 133: ...5 MCSMU_IV ...
Page 141: ...6 Memory ...
Page 211: ...7 MixedSignal ...
Page 249: ...8 NanoTech ...
Page 265: ...9 Organic ...
Page 269: ...10 PwrDevice ...
Page 285: ...11 Reliability ...
Page 377: ...12 Sample ...
Page 381: ...13 Solar Cell ...
Page 401: ...14 SPGU_PLSDIV ...
Page 409: ...15 Structure ...
Page 459: ...16 TFT ...
Page 463: ...17 Utility ...
Page 478: ...17 Utility Agilent EasyEXPERT Application Library Reference Edition 8 17 16 ...
Page 479: ...18 WGFMU ...
Page 493: ...19 WGFMU_IV ...
Page 505: ...20 GaN Diode ...
Page 511: ...21 GaN FET ...
Page 523: ...22 IGBT ...
Page 549: ...23 Interconnection ...
Page 553: ...24 MISCAP ...
Page 561: ...25 PowerBJT ...
Page 576: ...25 PowerBJT Agilent EasyEXPERT Application Library Reference Edition 8 25 16 ...
Page 577: ...26 PowerDiode ...
Page 585: ...27 PowerMOSFET PMIC SiC ...