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15 Structure
15.9
Diode BVAndCj-V SCUU: Diode junction capacitance and breakdown
voltage measurement using SCUU (A.01.20)
[Supported Analyzer]
B1500A
[Description]
Measures the reverse bias junction capacitance and breakdown voltage by using one MFCMU, two SMUs,
and a set of SCUU/GSWU.
For a more accurate measurement, perform correction data measurement at the measurement frequency before
starting the capacitance measurement.
If the measurement frequency is not included in the list of default frequencies below, click the Advanced
Options... button and set the measurement frequency on the Frequency area of the Advanced Options for CMU
Calibration window.
Default frequencies:
1 k, 2 k, 5 k, 10 k, 20 k, 50 k, 100 k, 200 k, 500 k, 1 M, 1.2 M, 1.5 M, 2 M, 2.5 M, 2.7 M, 3 M, 3.2 M, 3.5 M,
3.7 M, 4 M, 4.2 M, 4.5 M, 5 MHz
[Device Under Test]
Diode
[Required Modules and Accessories]
One MFCMU module, two SMU modules, and a set of SCUU/GSWU are required.
SCUU connections: Output1: anode, Output2: cathode
Connection wire must be connected between the GSWU and the DUT interface High/Low guard lines for the
capacitance measurements.
[Device Parameters]
L: Diode length
W: Diode width
Temp: Temperature
[Test Parameters]
IntegTime: Integration time
[Test Parameters: for Junction Capacitance Measurements]
AnodeAC: CMU connected to Anode terminal
FREQ: Measurement frequency
OscLevel: Measurement signal level
VBiasStart: DC bias start voltage
VBiasStop: DC bias stop voltage
VBiasStep: DC bias step voltage
[Test Parameters: for Breakdown Voltage Measurements]
AnodeDC: SMU connected to Anode terminal, primary sweep voltage output
VanodeStart: Sweep start voltage for Anode terminal
VanodeStop: Sweep stop voltage for Anode terminal
VanodeStep: Sweep step voltage for Anode terminal
Ianode@BV: Anode current at breakdown
CathodeDC: SMU connected to Cathode terminal, constant voltage output
[Extended Test Parameters]
Agilent EasyEXPERT Application Library Reference, Edition 8
15-18
Summary of Contents for EasyEXPERT
Page 1: ...Agilent Technologies Agilent EasyEXPERT Application Library Reference ...
Page 17: ...1 BJT ...
Page 63: ...2 CMOS ...
Page 119: ...3 Discrete ...
Page 127: ...4 GenericTest ...
Page 133: ...5 MCSMU_IV ...
Page 141: ...6 Memory ...
Page 211: ...7 MixedSignal ...
Page 249: ...8 NanoTech ...
Page 265: ...9 Organic ...
Page 269: ...10 PwrDevice ...
Page 285: ...11 Reliability ...
Page 377: ...12 Sample ...
Page 381: ...13 Solar Cell ...
Page 401: ...14 SPGU_PLSDIV ...
Page 409: ...15 Structure ...
Page 459: ...16 TFT ...
Page 463: ...17 Utility ...
Page 478: ...17 Utility Agilent EasyEXPERT Application Library Reference Edition 8 17 16 ...
Page 479: ...18 WGFMU ...
Page 493: ...19 WGFMU_IV ...
Page 505: ...20 GaN Diode ...
Page 511: ...21 GaN FET ...
Page 523: ...22 IGBT ...
Page 549: ...23 Interconnection ...
Page 553: ...24 MISCAP ...
Page 561: ...25 PowerBJT ...
Page 576: ...25 PowerBJT Agilent EasyEXPERT Application Library Reference Edition 8 25 16 ...
Page 577: ...26 PowerDiode ...
Page 585: ...27 PowerMOSFET PMIC SiC ...