Agilent Technologies EasyEXPERT, Manual, Page: 422 / 610

15 Structure
15.7 Cj-V: Junction capacitance Cj-V characteristics (A.01.11)
[Supported Analyzer]
B1500A
[Description]
Measures the junction capacitance (Cj), and plots the Cj-V characteristics.
For a more accurate measurement, perform correction data measurement at the measurement frequency before
starting the capacitance measurement.
If the measurement frequency is not included in the list of default frequencies below, click the Advanced
Options... button and set the measurement frequency on the Frequency area of the Advanced Options for CMU
Calibration window.
Default frequencies:
1 k, 2 k, 5 k, 10 k, 20 k, 50 k, 100 k, 200 k, 500 k, 1 M, 1.2 M, 1.5 M, 2 M, 2.5 M, 2.7 M, 3 M, 3.2 M, 3.5 M,
3.7 M, 4 M, 4.2 M, 4.5 M, 5 MHz
[Device Under Test]
Junction device, diode
[Device Parameters]
L: Junction length
W: Junction width
Temp: Temperature
[Test Parameters]
IntegTime: Integration time
FREQ: Measurement frequency
OscLevel: Measurement signal level
Anode: CMU connected between Anode and Cathode (CV sweep measurement)
VacStart: DC bias start voltage
VacStop: DC bias stop voltage
VacStep: DC bias step voltage
[Extended Test Parameters]
HoldTime: Hold time
DelayTime: Delay time
[Measurement Parameters]
Parallel capacitance Cp
Conductance G
[User Function]
PI=3.141592653589
D=G/(2*PI*FREQ*Cp)
Rp=1/G
Cs=(1+D^2)*Cp
X=-1/(2*PI*FREQ*Cs)
Rs=D*abs(X)
Z=sqrt(Rs^2+X^2)
Theta=atan(X/Rs)
Vgate=-Vsubs
CpPerArea=Cp/L/W
CpPerWg=Cp/W
Agilent EasyEXPERT Application Library Reference, Edition 8
15-14