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18 WGFMU
To obtain the stable result for the current measurement with range changing, set the sampling measurement start
time to the value which exceeds 100 micro seconds after the range is changed.
[Output_to_File_for_PatternValidation] Not effective for Run Vector mode
Output_Enable: Enable or Disable
Enable (saves the waveform and measurement setup data to the file specified by Output_Filename)
Disable (does not save)
Output_Filename: Absolute path name of the file to save the waveform and measurement setup data
[DataDisplay_for_RunVector] Not effective for Pattern Validation mode
DataDisplay_PatternValidation: PatternValidation data display mode
Disable (does not display PatternValidation data during measurement)
Enable_Waveform (displays Waveform during measurement)
Enable_Waveform_MeasTiming (displays Waveform and MeasTiming during measurement)
DataDisplay_Mode: Data Display window display mode
x(time)_y(meas): Time for X axis and measurement data for Y axis
x(meas1)_y(meas2): Ch1 measurement data for X axis and Ch2 measurement data for Y axis
[Extended Test Parameters]
LogToFile: Enable or Disable
Enable (logs error and warning)
Disable (does not log)
LogFile: Absolute path name of the log file
WarningLevel: Warning level
Off: No warning is reported
Severe: Severe warning is reported
Normal: Normal warning is reported
Information: Information warning is reported
IForceRange1: Current measurement range when the sampling measurement is started
1uA, 10uA, 100uA, 1mA, or 10mA
This value is effective until the range is changed by the range event.
Result_Update_Interval_s: Interval of updating the measurement result. 2 to 100 seconds.
Agilent EasyEXPERT Application Library Reference, Edition 8
18-14
Summary of Contents for EasyEXPERT
Page 1: ...Agilent Technologies Agilent EasyEXPERT Application Library Reference ...
Page 17: ...1 BJT ...
Page 63: ...2 CMOS ...
Page 119: ...3 Discrete ...
Page 127: ...4 GenericTest ...
Page 133: ...5 MCSMU_IV ...
Page 141: ...6 Memory ...
Page 211: ...7 MixedSignal ...
Page 249: ...8 NanoTech ...
Page 265: ...9 Organic ...
Page 269: ...10 PwrDevice ...
Page 285: ...11 Reliability ...
Page 377: ...12 Sample ...
Page 381: ...13 Solar Cell ...
Page 401: ...14 SPGU_PLSDIV ...
Page 409: ...15 Structure ...
Page 459: ...16 TFT ...
Page 463: ...17 Utility ...
Page 478: ...17 Utility Agilent EasyEXPERT Application Library Reference Edition 8 17 16 ...
Page 479: ...18 WGFMU ...
Page 493: ...19 WGFMU_IV ...
Page 505: ...20 GaN Diode ...
Page 511: ...21 GaN FET ...
Page 523: ...22 IGBT ...
Page 549: ...23 Interconnection ...
Page 553: ...24 MISCAP ...
Page 561: ...25 PowerBJT ...
Page 576: ...25 PowerBJT Agilent EasyEXPERT Application Library Reference Edition 8 25 16 ...
Page 577: ...26 PowerDiode ...
Page 585: ...27 PowerMOSFET PMIC SiC ...