Agilent Technologies EasyEXPERT, Manual, Page: 420 / 610

15 Structure
15.6 Cj-Freq Log: Cj-f characteristics, junction device (A.01.20)
[Supported Analyzer]
B1500A
[Description]
Measures the junction capacitance (Cj, linear) vs frequency (f, log) characteristics of a junction device. The
measurement frequency is 10 points per decade.
[Device Under Test]
Junction device (diode), 2 terminals
Connect CMU High and CMU Low to the anode and cathode respectively.
For a more accurate measurement, perform correction data measurement at the measurement frequency before
starting the capacitance measurement.
If the measurement frequency is not included in the list of default frequencies below, click the Advanced
Options... button and set the measurement frequency on the Frequency area of the Advanced Options for CMU
Calibration window.
Default frequencies:
1 k, 2 k, 5 k, 10 k, 20 k, 50 k, 100 k, 200 k, 500 k, 1 M, 1.2 M, 1.5 M, 2 M, 2.5 M, 2.7 M, 3 M, 3.2 M, 3.5 M,
3.7 M, 4 M, 4.2 M, 4.5 M, 5 MHz
[Required Modules and Accessories]
Agilent B1520A MFCMU 1 unit
[Device Parameters]
L: Junction length
W: Junction width
Temp: Temperature (deg C)
[Test Parameters]
IntegTime: Integration time
FreqStart: Sweep start frequency, LOG sweep
NoOfDecade: Number of decades for data collection
OscLevel: Measurement signal level
Anode: CMU connected between Anode and Cathode
Vanode: Voltage applied on Anode
[Extended Test Parameters]
G_Min: Minimum transconductance value for graph
G_Max: Maximum transconductance value for graph
Cp_Min: Minimum capacitance value for graph
Cp_Max: Maximum capacitance value for graph
[Measurement Parameters]
Parallel capacitance Cp
Conductance G
[User Function]
Circular constant PI=3.141592653589
Frequency Frequency=Freq
Dissipation factor D=G/(2*PI*Freq*Cp)
Parallel resistance Rp=1/G
Series capacitance Cs=(1+D^2)*Cp
Agilent EasyEXPERT Application Library Reference, Edition 8
15-12