
⎯
210
⎯
6 F 2 S 0 8 4 6
Note:
To release the latch state, refer to Section 4.2.1.
Assigning signals
•
Press 2 on the "Setting" screen to display the "Input to logic gate" screen.
/ 4
I n p u t t o
l o g i c
g a t e
1 / 4
I n
# 1 (
0 -
0 7 1 ) :
2 1
I n
# 2 (
0 -
0 7 1 ) :
4
I n
# 3 (
0 -
0 7 1 ) :
6 7
I n
# 4 (
0 -
0 7 1 ) :
0
3
3
3
3
•
Assign signals to gates (In #1- #4) by entering the number corresponding to each signal
referring to Appendix B.
Note:
If signals are not assigned to all the gates #1-#4, enter 0 to the unassigned gate(s).
Repeat this process for other LEDs to be configured.
4.2.7 Testing
The sub-menu "Test" provides such functions as setting of test switches, manual starting of
automatic tests, forced operation of binary outputs, time measurement of the variable setting timer
and logic signal observation. The password must be entered in order to enter the test screens
because the "Test" menu has password security protection. (See the section 4.2.6.2.)
4.2.7.1 Setting the Switches
The automatic monitor function (A.M.F.) can be disabled by setting the switch [A.M.F] to "Off."
Disabling the A.M.F. inhibits trip blocking even in the event of a failure in the items being
monitored by this function. It also prevents failures from being displayed on the "ALARM" LED
and LCD described in Section 4.2.1. No events related to the A.M.F. are recorded, either.
Disabling A.M.F. is useful for blocking the output of unnecessary alarms during testing.
Note:
Set the switch [A.M.F] to "Off" before applying the test inputs, when the A.M.F is disabled.
When a three-phase voltage source is not available, the distance measuring element operation can
be tested using a single-phase voltage source by setting the switch [Z1S-1PH] to "On". This is not
fit for the high-accuracy test, though.
The switch [ZB-CTRL] is used to test the Z1 characteristic with offset or not. When the switch
[ZB-CTRL] is set to "1", the Z1 is an offset characteristic. When the switch [ZB-CTRL] is set to
"2", the Z1 is a characteristic without offset.
Offset
characteristic
(setting "1")
X
R
X
(b) Quadrilateral
(a) Mho
Figure 4.2.7.1 Z1 Characteristics by [ZB-CTRL] Setting
The gradient characteristic of Zone 1 and Zone 1X reactance elements is obtained only when the
Summary of Contents for GRZ100 B Series
Page 264: ... 263 6 F 2 S 0 8 4 6 Appendix A Block Diagram ...
Page 271: ... 270 6 F 2 S 0 8 4 6 ...
Page 272: ... 271 6 F 2 S 0 8 4 6 Appendix B Signal List ...
Page 307: ... 306 6 F 2 S 0 8 4 6 ...
Page 308: ... 307 6 F 2 S 0 8 4 6 Appendix C Variable Timer List ...
Page 310: ... 309 6 F 2 S 0 8 4 6 Appendix D Binary Input Output Default Setting List ...
Page 321: ... 320 6 F 2 S 0 8 4 6 ...
Page 322: ... 321 6 F 2 S 0 8 4 6 Appendix E Details of Relay Menu and LCD Button Operation ...
Page 331: ... 330 6 F 2 S 0 8 4 6 ...
Page 340: ... 339 6 F 2 S 0 8 4 6 Appendix G Typical External Connections ...
Page 377: ... 376 6 F 2 S 0 8 4 6 ...
Page 384: ... 383 6 F 2 S 0 8 4 6 Appendix J Return Repair Form ...
Page 388: ... 387 6 F 2 S 0 8 4 6 Customer Name Company Name Address Telephone No Facsimile No Signature ...
Page 389: ... 388 6 F 2 S 0 8 4 6 ...
Page 390: ... 389 6 F 2 S 0 8 4 6 Appendix K Technical Data ...
Page 401: ... 400 6 F 2 S 0 8 4 6 ...
Page 402: ... 401 6 F 2 S 0 8 4 6 Appendix L Symbols Used in Scheme Logic ...
Page 405: ... 404 6 F 2 S 0 8 4 6 ...
Page 406: ... 405 6 F 2 S 0 8 4 6 Appendix M Example of Setting Calculation ...
Page 417: ... 416 6 F 2 S 0 8 4 6 ...
Page 418: ... 417 6 F 2 S 0 8 4 6 Appendix N IEC60870 5 103 Interoperability and Troubleshooting ...
Page 434: ... 433 6 F 2 S 0 8 4 6 Appendix P Inverse Time Characteristics ...
Page 437: ... 436 6 F 2 S 0 8 4 6 ...
Page 438: ... 437 6 F 2 S 0 8 4 6 Appendix Q Failed Module Tracing and Replacement ...
Page 444: ... 443 6 F 2 S 0 8 4 6 Appendix R Ordering ...
Page 447: ......